A Continuous Electron Density Approach in Rietveld Analysis for Structure Investigations of the Mesoporous Silicate Materials Full article
Conference |
49th Annual Denver X-ray Conference 31 Jul - 4 Aug 2000 , Denver, Colorado |
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Journal |
Advances in X-Ray Analysis
ISSN: 0376-0308 |
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Output data | Year: 2001, Volume: 44, Pages: 110-115 Pages count : 6 | ||||
Authors |
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Affiliations |
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Funding (1)
1 | International Association for the Promotion of Co-operation with Scientists from the New Independent States of the Former Soviet Union | IR-97-0676 |
Abstract:
A procedure of the structure factor simulation from a continuous electron density representation in combination with the full-profile structure refinement (Rietveld technique) was developed and applied to structural characterization of pure siliceous mesoporous mesophase materials C16-SiO2-MMM of the MCM-41 type. An analytical function was exploited to simulate the continuous electron density. The function arguments were used as refinable structure parameters. The technique allows both the least-squares refinement of structural parameters using the fullprofile fitting and the E-map calculations providing additional information on the structure details. Determined pore sizes were in good agreement with those obtained by independent absorption-based method. The pore shape was found to be close to hexagonal geometry.
Cite:
Solovyov L.A.
, Kirik S.D.
, Shmakov A.N.
, Romannikov V.N.
A Continuous Electron Density Approach in Rietveld Analysis for Structure Investigations of the Mesoporous Silicate Materials
Advances in X-Ray Analysis. 2001. V.44. P.110-115. РИНЦ
A Continuous Electron Density Approach in Rietveld Analysis for Structure Investigations of the Mesoporous Silicate Materials
Advances in X-Ray Analysis. 2001. V.44. P.110-115. РИНЦ
Identifiers:
Elibrary | 29250798 |
Chemical Abstracts | 2002:385931 |
Chemical Abstracts (print) | 137:50911 |
publication.block.citing_info:
БД | Цитирований |
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Elibrary | 15 |