Systematic Study of Metal Particles (Pt, Ni) Contrast on Amorphous Support (Silica) Using Multislice Full article
Conference |
Electron Crystallography: 26th crystallographic course 22 May - 2 Jun 1997 , Erice |
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Source | Electron Crystallography Compilation, Springer. Dordrecht.1997. 439 c. ISBN 9789048149650; 9789401589710. |
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Journal |
NATO Science Series Series E: Applied Sciences
ISSN: 0168-132X |
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Output data | Year: 1997, Volume: 347, Pages: 371-374 Pages count : 4 DOI: 10.1007/978-94-015-8971-0_34 | ||
Authors |
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Affiliations |
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Funding (1)
1 | Russian Foundation for Basic Research | 93-03-04836 |
Abstract:
Metal particles being viewed on the background of amorphous support is the common system when studying catalysts by TEM. Usual problems one deal with studying samples of this kind are: particles size is of the same order of magnitude as point spread function of instrument, that causes visible particle size to depend on defocus value; amorphous contrast of support suppresses particle images and corrupts them drastically.
Cite:
Chuvilin A.L.
, Chesnokova T.E.
Systematic Study of Metal Particles (Pt, Ni) Contrast on Amorphous Support (Silica) Using Multislice
In compilation Electron Crystallography. – Springer., 1997. – C.371-374. – ISBN 9789048149650; 9789401589710. DOI: 10.1007/978-94-015-8971-0_34 WOS
Systematic Study of Metal Particles (Pt, Ni) Contrast on Amorphous Support (Silica) Using Multislice
In compilation Electron Crystallography. – Springer., 1997. – C.371-374. – ISBN 9789048149650; 9789401589710. DOI: 10.1007/978-94-015-8971-0_34 WOS
Identifiers:
Web of science | WOS:000074633500034 |
Chemical Abstracts | 1998:79217 |
OpenAlex | W2257286478 |
Citing:
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