Study of Thin Ge Films with Amorphous and Nanocrystalline Phases via the Techniques of EXAFS Spectroscopy and AFM Full article
Journal |
Journal of Surface Investigation: X-Ray, Synchrotron and Neutron Techniques
ISSN: 1027-4510 , E-ISSN: 1819-7094 |
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Output data | Year: 2010, Volume: 4, Number: 1, Pages: 136-141 Pages count : 6 DOI: 10.1134/S1027451010010209 | ||||||
Tags | Atomic Force Microscopy Image; Surface Investigation; Neutron Technique; Pair Correlation Function; Ultrahigh Vacuum | ||||||
Authors |
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Affiliations |
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Funding (2)
1 | Russian Foundation for Basic Research | 06-03-32662 |
2 | Russian Foundation for Basic Research | 07-02-00391 |
Abstract:
The local atomic structure and surface morphology of thin semiconductor films of Ge have been studied via extended X-ray absorption fine structure spectroscopy and atomic force microscopy. The films have been obtained by thermal evaporation of a material in an ultrahigh vacuum at different substrate temperatures. The films contain both amorphous and nanocrystalline phases. The percentage of the phases depends on the condensation temperature. The classical linear dependence of grain sizes on condensation temperature T is violated at T=100°C.
Cite:
Valeev R.G.
, Deev A.N.
, Surnin D.V.
, Kriventsov V.V.
, Karban O.V.
, Vetoshkin V.M.
, Pivovarova O.I.
Study of Thin Ge Films with Amorphous and Nanocrystalline Phases via the Techniques of EXAFS Spectroscopy and AFM
Journal of Surface Investigation: X-Ray, Synchrotron and Neutron Techniques. 2010. V.4. N1. P.136-141. DOI: 10.1134/S1027451010010209 WOS Scopus РИНЦ
Study of Thin Ge Films with Amorphous and Nanocrystalline Phases via the Techniques of EXAFS Spectroscopy and AFM
Journal of Surface Investigation: X-Ray, Synchrotron and Neutron Techniques. 2010. V.4. N1. P.136-141. DOI: 10.1134/S1027451010010209 WOS Scopus РИНЦ
Original:
Валеев Р.Г.
, Деев А.Н.
, Сурнин Д.В.
, Кривенцов В.В.
, Карбан О.В.
, Ветошкин В.М.
, Пивоварова О.И.
Исследование тонких пленок Ge с аморфно-нанокристаллической структурой методами EXAFS-спектроскопии и АСМ
Поверхность. Рентгеновские, синхротронные и нейтронные исследования. 2010. №2. С.60-65. РИНЦ
Исследование тонких пленок Ge с аморфно-нанокристаллической структурой методами EXAFS-спектроскопии и АСМ
Поверхность. Рентгеновские, синхротронные и нейтронные исследования. 2010. №2. С.60-65. РИНЦ
Dates:
Submitted: | Jul 14, 2009 |
Published print: | Feb 1, 2010 |
Published online: | Mar 1, 2010 |
Identifiers:
Web of science | WOS:000275122300020 |
Scopus | 2-s2.0-77649220779 |
Elibrary | 15320637 |
OpenAlex | W2014764387 |
Citing:
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