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Novikov Yurij Nikolaevich

Identifiers

Elibrary ID: 10603
Scopus ID: 57193379626

Affiliations

# Name Period Items
1 Rzhanov Institute of Semiconductor Physics SB RAS 2002 - 2018 5

Научная деятельность

Articles in journal - 4

Articles in journal (4) More info

1 Gritsenko V.A. , Novikov Y.N. , Perevalov T.V. , Kruchinin V.N. , Aliev V.S. , Gerasimova A.K. , Erenburg S.B. , Trubina S.V. , Kvashnina K.O. , Prosvirin I.P. , Lanza M.
Nanoscale Potential Fluctuations in Zirconium Oxide and the Flash Memory Based on Electron and Hole Localization
Advanced Electronic Materials. 2018. 1700592 :1-8. DOI: 10.1002/aelm.201700592 WOS Scopus РИНЦ AN: 2018:1320605
2 Gritsenko V.A. , Novikov Y.N. , Shaposhnikov A.V. , Wong H. , Zhidomirov G.M.
Capturing Properties of Three-Fold Coordinated Silicon Atom in Silicon Nitride: A Positive Correlation Energy Model
Физика твердого тела. 2003. V.45. N11. P.1934-1937. РИНЦ
3 Gritsenko V.A. , Novikov Y.N. , Shaposhnikov A.V. , Wong H. , Zhidomirov G.M.
Capturing Properties of a Threefold Coordinated Silicon Atom in Silicon Nitride: Positive Correlation Energy Model
Physics of the Solid State. 2003. V.45. N11. P.2031-2035. DOI: 10.1134/1.1626733 WOS Scopus РИНЦ AN: 2003:896620 CAN: 140:187802
4 Gritsenko V.A. , Shaposhnikov A.V. , Novikov Y.N. , Baraban A.P. , Wong H. , Zhidomirov G.M. , Roger M.
Onefold Coordinated Oxygen Atom: An Electron Trap in the Silicon Oxide
Microelectronics Reliability. 2003. V.43. N4. P.665-669. DOI: 10.1016/S0026-2714(03)00030-1 WOS Scopus РИНЦ AN: 2003:380541 CAN: 140:102658