Enhanced Compositional Contrast in Imaging of Nanoprecipitates Buried in a Defective Crystal Using a Conventional TEM Научная публикация
Журнал |
Microscopy and Microanalysis
ISSN: 1431-9276 , E-ISSN: 1435-8115 |
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Вых. Данные | Год: 2003, Том: 9, Номер: 1, Страницы: 36-41 Страниц : 6 DOI: 10.1017/S143192760303006X | ||||
Ключевые слова | Annular dark-field detector, Conventional TEM, Diffraction contrast, Nanoprecipitates | ||||
Авторы |
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Организации |
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Реферат:
In this article, we show that nanometer-sized precipitates of atomic numbers higher than those of the surrounding crystalline matrix can be clearly revealed in a conventional transmission electron microscope by high-angle, centered dark-field imaging after minimizing the diffraction contrast. The effect is similar to that of Z-contrast STEM, albeit with a spatial resolution limited to 1 nm. Its sensitivity to atomic number differences between precipitates and matrix is about 10, which is demonstrated for precipitates formed after Er, Ge, Cr, and Si ion implantation into SiC.
Библиографическая ссылка:
Kaiser U.
, Chuvilin A.
Enhanced Compositional Contrast in Imaging of Nanoprecipitates Buried in a Defective Crystal Using a Conventional TEM
Microscopy and Microanalysis. 2003. V.9. N1. P.36-41. DOI: 10.1017/S143192760303006X WOS Scopus РИНЦ
Enhanced Compositional Contrast in Imaging of Nanoprecipitates Buried in a Defective Crystal Using a Conventional TEM
Microscopy and Microanalysis. 2003. V.9. N1. P.36-41. DOI: 10.1017/S143192760303006X WOS Scopus РИНЦ
Даты:
Поступила в редакцию: | 6 февр. 2002 г. |
Принята к публикации: | 6 июн. 2002 г. |
Опубликована online: | 31 янв. 2003 г. |
Опубликована в печати: | 1 февр. 2003 г. |
Идентификаторы БД:
Web of science | WOS:000180752300004 |
Scopus | 2-s2.0-0037291244 |
РИНЦ | 13430021 |
Chemical Abstracts | 2003:54841 |
Chemical Abstracts (print) | 139:401728 |
OpenAlex | W2110360419 |