X-Ray Structural Modeling of Silicate Mesoporous Mesophase Material Научная публикация
Конференция |
Mesoporous Molecular Sieves : 2nd International Symposium 27 авг. - 2 сент. 2000 , Quebec City |
||||
---|---|---|---|---|---|
Журнал |
Microporous and Mesoporous Materials
ISSN: 1387-1811 , E-ISSN: 1873-3093 |
||||
Вых. Данные | Год: 2001, Том: 44-45, Страницы: 17-23 Страниц : 7 DOI: 10.1016/S1387-1811(01)00164-0 | ||||
Ключевые слова | Electron density distribution, Rietveld's technique, Silicate mesoporous material, Wall structure, X-ray modeling | ||||
Авторы |
|
||||
Организации |
|
Информация о финансировании (1)
1 | International Association for the Promotion of Co-operation with Scientists from the New Independent States of the Former Soviet Union | IR-97-0676 |
Реферат:
Rietveld’s technique in combination with a continuous electron density representation was applied to structural modeling of highly ordered pure siliceous mesoporous mesophase material C16-SiO2-MMM of the MCM-41 type prepared by hydrothermal synthesis in the presence of C16H33N(CH3)3Br. Several important characteristics of the material in both as-synthesized and calcined forms were revealed. In particular, it was found that mesopores in the materials are of true hexagonal shape, and the wall electron density seems to be not continuous.
Библиографическая ссылка:
Solovyov L.A.
, Kirik S.D.
, Shmakov A.N.
, Romannikov V.N.
X-Ray Structural Modeling of Silicate Mesoporous Mesophase Material
Microporous and Mesoporous Materials. 2001. V.44-45. P.17-23. DOI: 10.1016/S1387-1811(01)00164-0 WOS Scopus РИНЦ
X-Ray Structural Modeling of Silicate Mesoporous Mesophase Material
Microporous and Mesoporous Materials. 2001. V.44-45. P.17-23. DOI: 10.1016/S1387-1811(01)00164-0 WOS Scopus РИНЦ
Даты:
Поступила в редакцию: | 10 февр. 2000 г. |
Принята к публикации: | 5 июн. 2000 г. |
Опубликована в печати: | 1 июн. 2001 г. |
Опубликована online: | 13 июн. 2001 г. |
Идентификаторы БД:
Web of science | WOS:000169557700004 |
Scopus | 2-s2.0-0035363299 |
РИНЦ | 13375795 |
Chemical Abstracts | 2001:458000 |
Chemical Abstracts (print) | 135:234153 |
OpenAlex | W2038635450 |