Enhanced Compositional Contrast in Imaging of Nanoprecipitates Buried in a Defective Crystal Using a Conventional TEM Full article
Journal |
Microscopy and Microanalysis
ISSN: 1431-9276 , E-ISSN: 1435-8115 |
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Output data | Year: 2003, Volume: 9, Number: 1, Pages: 36-41 Pages count : 6 DOI: 10.1017/S143192760303006X | ||||
Tags | Annular dark-field detector, Conventional TEM, Diffraction contrast, Nanoprecipitates | ||||
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Abstract:
In this article, we show that nanometer-sized precipitates of atomic numbers higher than those of the surrounding crystalline matrix can be clearly revealed in a conventional transmission electron microscope by high-angle, centered dark-field imaging after minimizing the diffraction contrast. The effect is similar to that of Z-contrast STEM, albeit with a spatial resolution limited to 1 nm. Its sensitivity to atomic number differences between precipitates and matrix is about 10, which is demonstrated for precipitates formed after Er, Ge, Cr, and Si ion implantation into SiC.
Cite:
Kaiser U.
, Chuvilin A.
Enhanced Compositional Contrast in Imaging of Nanoprecipitates Buried in a Defective Crystal Using a Conventional TEM
Microscopy and Microanalysis. 2003. V.9. N1. P.36-41. DOI: 10.1017/S143192760303006X WOS Scopus РИНЦ
Enhanced Compositional Contrast in Imaging of Nanoprecipitates Buried in a Defective Crystal Using a Conventional TEM
Microscopy and Microanalysis. 2003. V.9. N1. P.36-41. DOI: 10.1017/S143192760303006X WOS Scopus РИНЦ
Dates:
Submitted: | Feb 6, 2002 |
Accepted: | Jun 6, 2002 |
Published online: | Jan 31, 2003 |
Published print: | Feb 1, 2003 |
Identifiers:
Web of science | WOS:000180752300004 |
Scopus | 2-s2.0-0037291244 |
Elibrary | 13430021 |
Chemical Abstracts | 2003:54841 |
Chemical Abstracts (print) | 139:401728 |
OpenAlex | W2110360419 |