Scanning Electron Microscopy Study of Platinum Catalysts Etching
IV International Scientific School-Conference for Young Scientists in Memory of Professor L.N. Kurina «Catalysis: from Science to Industry»
23-27 Oct 2016
||Catalysis: from science to industry: proceedings of IV International scientific school-conference for young scientists in memory of Professor L.N. Kurina
“Ivan Fedorov” publishing. Tomsk.2016.
Boreskov Institute of Catalysis SB RAS, Novosibirsk, Russia
Federal Agency for Scientific Organizations
To study the physical and chemical characteristics of solid materials a variety of physical methods of research are used. The most widely used method for research and measuring physical properties of various materials is scanning electron microscopy (SEM). This method allows obtaining a number of different properties of the micro- and nanoobjects by scanning the electron probe. Due to the significant progress in the development of electron microscopy settings of the electronic probe are widely varied in the current scanning microscopes. It makes this method extremely flexible not only for research but also for the characterization of materials. SEM can be easily integrated into a single tool with such applications as X-ray microanalysis (PMA), electron backscatter diffraction (EBSD) and several others, which greatly expands the possibilities for the analysis and characterization of micro - and nanomaterials.
Using of these applications allows carrying out a comprehensive study of various material characteristics, such as morphology, chemical composition and structure. Application SEM allows imaging material surface in the range of magnification from 10 to 1 000 000x with resolution, reaching less than 1 nm. The current trend in the development of SEM is associated with application of the electron probe with low energy electrons. Modern microscopes allow to obtain microscopic images of objects in a wide range of magnifications with high resolution when the probe electron energy is varied from 30 keV to 100 eV. Reducing the energy of the electrons in this range allows you to change the depth of penetration of the electrons in the volume of material from a few microns to a few nanometers. As a result, it is possible to
vary the depth of the analysis in such a range that allows analyzing the volume of the material and its surface. This mode is commonly used for studying catalysts, since the active component of catalyst is distributed not only on the catalyst surface, but also in its volume. The variation of the probe electron energy allows us to analyze the distribution of the active component in the volume of catalyst granule.