High-Resolution Diffractometer for Structural Studies of Polycrystalline Materials Full article
Journal |
Journal of Structural Chemistry
ISSN: 0022-4766 , E-ISSN: 1573-8779 |
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Output data | Year: 1994, Volume: 35, Number: 2, Pages: 224-228 Pages count : 5 DOI: 10.1007/BF02578312 | ||
Tags | Synchrotron Radiation; Crystal Analyzer; Synchrotron Radiation Beam; Anomalous Scattering; Oscillation Curve | ||
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Abstract:
A high-resolution powder diffraction station with synchrotron radiation has been created. The diffractometer was developed on the basis of two Microcontrol precision goniometers. The latter provide the independent movement of a specimen and a detector with a minimal step of 2θ=0.001°. Using the Si(111) crystal as the analyzer, we obtained half widths of the (212), (203), and (301) reflections for α-SiO2 (0.02–0.025° 2θ). The device was tested using α-Al2O3 as the standard.
Cite:
Shmakov A.N.
, Mytnichenko S.V.
, Tsybulya S.V.
, Solovyeva L.P.
, Tolochko B.P.
High-Resolution Diffractometer for Structural Studies of Polycrystalline Materials
Journal of Structural Chemistry. 1994. V.35. N2. P.224-228. DOI: 10.1007/BF02578312 WOS Scopus РИНЦ
High-Resolution Diffractometer for Structural Studies of Polycrystalline Materials
Journal of Structural Chemistry. 1994. V.35. N2. P.224-228. DOI: 10.1007/BF02578312 WOS Scopus РИНЦ
ArticleLinkType.TRANSLATED_TO_ORIGINAL:
Шмаков А.Н.
, Мытниченко С.В.
, Цыбуля С.В.
, Соловьева Л.П.
, Толочко Б.П.
Дифрактометр высокого разрешения для структурных исследований поликристаллических материалов
Журнал структурной химии. 1994. Т.35. №2. С.85-91. РИНЦ
Дифрактометр высокого разрешения для структурных исследований поликристаллических материалов
Журнал структурной химии. 1994. Т.35. №2. С.85-91. РИНЦ
Dates:
Submitted: | May 13, 1993 |
Published print: | Mar 1, 1994 |
Identifiers:
Web of science | WOS:A1994PR42800012 |
Scopus | 2-s2.0-51249164811 |
Elibrary | 29218981 |
OpenAlex | W2079989003 |