Application of Secondary Ion Mass Spectrometry for Analyzing the Composition and Structure of Surface Layers of Fine Materials Full article
Journal |
Journal of Structural Chemistry
ISSN: 0022-4766 , E-ISSN: 1573-8779 |
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Output data | Year: 2010, Volume: 51, Number: Supplement, Pages: S53-S58 Pages count : 6 DOI: 10.1007/s10947-010-0189-6 | ||
Tags | fine materials, surface, secondary ion mass spectrometry, catalysts | ||
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Abstract:
Fundamental and methodological aspects of secondary ion mass spectrometry applied to analysis of elemental/phase composition and structure of the surface layers of fine materials are discussed.
Cite:
Ivanov V.P.
Application of Secondary Ion Mass Spectrometry for Analyzing the Composition and Structure of Surface Layers of Fine Materials
Journal of Structural Chemistry. 2010. V.51. NSupplement. P.S53-S58. DOI: 10.1007/s10947-010-0189-6 РИНЦ
Application of Secondary Ion Mass Spectrometry for Analyzing the Composition and Structure of Surface Layers of Fine Materials
Journal of Structural Chemistry. 2010. V.51. NSupplement. P.S53-S58. DOI: 10.1007/s10947-010-0189-6 РИНЦ
Original:
Иванов В.П.
Применение вторичной ионной масс-спектрометрии для анализа состава и структуры поверхностных слоев высокодисперсных материалов
Журнал структурной химии. 2010. Т.51. №7. С.S58-S63. RSCI РИНЦ
Применение вторичной ионной масс-спектрометрии для анализа состава и структуры поверхностных слоев высокодисперсных материалов
Журнал структурной химии. 2010. Т.51. №7. С.S58-S63. RSCI РИНЦ
Dates:
Submitted: | Oct 30, 2009 |
Published print: | Dec 1, 2010 |
Published online: | May 22, 2011 |
Identifiers:
Elibrary | 21108714 |
Chemical Abstracts | 2011:808472 |
Chemical Abstracts (print) | 155:81975 |
OpenAlex | W2087271990 |
Citing:
DB | Citing |
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OpenAlex | 1 |