X-Ray Structural Modeling of Silicate Mesoporous Mesophase Material Full article
Conference |
Mesoporous Molecular Sieves : 2nd International Symposium 27 Aug - 2 Sep 2000 , Quebec City |
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Journal |
Microporous and Mesoporous Materials
ISSN: 1387-1811 , E-ISSN: 1873-3093 |
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Output data | Year: 2001, Volume: 44-45, Pages: 17-23 Pages count : 7 DOI: 10.1016/S1387-1811(01)00164-0 | ||||
Tags | Electron density distribution, Rietveld's technique, Silicate mesoporous material, Wall structure, X-ray modeling | ||||
Authors |
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Affiliations |
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Funding (1)
1 | International Association for the Promotion of Co-operation with Scientists from the New Independent States of the Former Soviet Union | IR-97-0676 |
Abstract:
Rietveld’s technique in combination with a continuous electron density representation was applied to structural modeling of highly ordered pure siliceous mesoporous mesophase material C16-SiO2-MMM of the MCM-41 type prepared by hydrothermal synthesis in the presence of C16H33N(CH3)3Br. Several important characteristics of the material in both as-synthesized and calcined forms were revealed. In particular, it was found that mesopores in the materials are of true hexagonal shape, and the wall electron density seems to be not continuous.
Cite:
Solovyov L.A.
, Kirik S.D.
, Shmakov A.N.
, Romannikov V.N.
X-Ray Structural Modeling of Silicate Mesoporous Mesophase Material
Microporous and Mesoporous Materials. 2001. V.44-45. P.17-23. DOI: 10.1016/S1387-1811(01)00164-0 WOS Scopus РИНЦ
X-Ray Structural Modeling of Silicate Mesoporous Mesophase Material
Microporous and Mesoporous Materials. 2001. V.44-45. P.17-23. DOI: 10.1016/S1387-1811(01)00164-0 WOS Scopus РИНЦ
Dates:
Submitted: | Feb 10, 2000 |
Accepted: | Jun 5, 2000 |
Published print: | Jun 1, 2001 |
Published online: | Jun 13, 2001 |
Identifiers:
Web of science | WOS:000169557700004 |
Scopus | 2-s2.0-0035363299 |
Elibrary | 13375795 |
Chemical Abstracts | 2001:458000 |
Chemical Abstracts (print) | 135:234153 |
OpenAlex | W2038635450 |