1
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Voronkovskii V.A.
,
Perevalov T.V.
,
Iskhakzay R.M.H.
,
Aliev V.S.
,
Gritsenko V.A.
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Prosvirin I.P.
Phonon-Assisted Electron Tunneling between Traps in Silicon Oxide Films Treated in Hydrogen Plasma
Journal of Non-Crystalline Solids. 2020.
V.546. 120256
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2
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Voronkovskii V.A.
,
Aliev V.S.
,
Gerasimova A.K.
,
Perevalov T.V.
,
Prosvirin I.P.
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Islamov D.R.
Influence of the Active TaN/ZrOx/Ni Memristor Layer Oxygen Content on Forming and Resistive Switching Behavior
Nanotechnology. 2020.
DOI: 10.1088/1361-6528/abce7b
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3
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Perevalov T.V.
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Iskhakzai R.M.K.
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Aliev V.S.
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Gritsenko V.A.
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Prosvirin I.P.
Atomic and Electronic Structure of SiOx Films Obtained with Hydrogen Electron Cyclotron Resonance Plasma
Journal of Experimental and Theoretical Physics. 2020.
V.131. N6. P.940-944. DOI: 10.1134/s1063776120110084
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4
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Gritsenko V.A.
,
Perevalov T.V.
,
Voronkovskii V.A.
,
Gismatulin A.A.
,
Kruchinin V.N.
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Aliev V.S.
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Pustovarov V.A.
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Prosvirin I.P.
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Roizin Y.
Charge Transport and the Nature of Traps in Oxygen Deficient Tantalum Oxide
ACS Applied Materials and Interfaces. 2018.
V.10. N4. P.3769-3775. DOI: 10.1021/acsami.7b16753
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5
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Perevalov T.V.
,
Gritsenko V.A.
,
Gismatulin A.A.
,
Voronkovskii V.A.
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Gerasimova A.K.
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Aliev V.S.
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Prosvirin I.A.
Electronic Structure and Charge Transport in Nonstoichiometric Tantalum Oxide
Nanotechnology. 2018.
V.29. N26. 264001
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6
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Gritsenko V.A.
,
Volodin V.A.
,
Perevalov T.V.
,
Kruchinin V.N.
,
Gerasimova A.K.
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Aliev V.S.
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Prosvirin I.P.
Nanoscale Potential Fluctuations in Nonstoichiometrics Tantalum Oxide
Nanotechnology. 2018.
V.29. N42. 425202
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7
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Gritsenko V.A.
,
Novikov Y.N.
,
Perevalov T.V.
,
Kruchinin V.N.
,
Aliev V.S.
,
Gerasimova A.K.
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Erenburg S.B.
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Trubina S.V.
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Kvashnina K.O.
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Prosvirin I.P.
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Lanza M.
Nanoscale Potential Fluctuations in Zirconium Oxide and the Flash Memory Based on Electron and Hole Localization
Advanced Electronic Materials. 2018.
1700592
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8
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Aliev V.S.
,
Gerasimova A.K.
,
Kruchinin V.N.
,
Gritsenko V.A.
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Prosvirin I.P.
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Badmaeva I.A.
The Atomic Structure and Chemical Composition of HfOx (x<2) Films Prepared by Ion-Beam Sputtering Deposition
Materials Research Express. 2016.
V.3. P.085008-1-8. DOI: 10.1088/2053-1591/3/8/085008
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9
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Islamov D.R.
,
Kruchinin V.N.
,
Aliev V.S.
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Perevalov T.V.
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Gritsenko V.A.
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Prosvirin I.P.
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Orlov O.M.
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Chin A.
Potential Fluctuation in RRAM Based on Non-Stoichiometric Hafnium Sub-Oxides
Advances in Science and Technology. 2016.
V.99. P.69-74. DOI: 10.4028/www.scientific.net/ast.99.69
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10
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Orlov O.M.
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Krasnikov G.Y.
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Gritsenko V.A.
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Kruchinin V.N.
,
Perevalov T.V.
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Aliev V.S.
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Islamov D.R.
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Prosvirin I.P.
Nanoscale Potential Fluctuation in Non-Stoichiometric Hafnium Suboxides
ECS Transactions. 2015.
V.69. N5. P.237-241. DOI: 10.1149/06905.0237ecst
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11
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Kruchinin V.N.
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Aliev V.S.
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Perevalov T.V.
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Islamov D.R.
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Gritsenko V.A.
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Prosvirin I.P.
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Cheng C.H.
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Chin A.
Nanoscale Potential Fluctuation in Non-Stoichiometric HfOx and Low Resistive Transport in RRAM
Microelectronic Engineering. 2015.
V.147. P.165-167. DOI: 10.1016/j.mee.2015.04.091
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12
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Perevalov T.V.
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Aliev V.S.
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Gritsenko V.A.
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Saraev A.A.
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Kaichev V.V.
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Ivanova E.V.
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Zamoryanskaya M.V.
The Origin of 2.7 eV Luminescence and 5.2 eV Excitation Band in Hafnium Ooxide
Applied Physics Letters. 2014.
V.104. N7. P.071904-1-071904-5. DOI: 10.1063/1.4865259
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13
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Perevalov T.V.
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Aliev V.S.
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Gritsenko V.A.
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Saraev A.A.
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Kaichev V.V.
Electronic Structure of Oxygen Vacancies in Hafnium Oxide
Microelectronic Engineering. 2013.
V.109. P.21-23. DOI: 10.1016/j.mee.2013.03.005
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14
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Ivanov M.V.
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Perevalov T.V.
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Aliev V.S.
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Gritsenko V.A.
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Kaichev V.V.
Electronic Structure of δ-Ta2O5 with Oxygen Vacancy: ab initio Calculations and Comparison with Experiment
Journal of Applied Physics. 2011.
V.110. P.024115-1 - 024115-5. DOI: 10.1063/1.3606416
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15
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Ivanov M.V.
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Perevalov T.V.
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Aliev V.S.
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Gritsenko V.A.
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Kaichev V.V.
Ab initio Simulation of the Electronic Structure of δ-Ta2O5 with Oxygen Vacancy and Comparison with Experiment
Journal of Experimental and Theoretical Physics. 2011.
V.112. N6. P.1035-1041. DOI: 10.1134/S1063776111050037
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16
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Atuchin V.V.
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Kruchinin V.N.
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Kalinkin A.V.
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Aliev V.S.
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Rykhlitskii S.V.
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Shvets V.A.
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Optical Properties of the HfO2 – xNx and TiO2 – xNx Films Prepared by Ion Beam Sputtering
Optics and Spectroscopy. 2009.
V.106. N1. P.72-77. DOI: 10.1134/S0030400X09010093
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17
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Ramana C.V.
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Ewing R.
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Becker U.
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Atuchin V.V.
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Spectroscopic Ellipsometry Characterization of the Optical Properties and Thermal Stability of Zr O2 Films Made by Ion-Beam Assisted Deposition
Applied Physics Letters. 2008.
V.92. N1. P.011917. DOI: 10.1063/1.2811955
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18
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Shvets V.A.
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Aliev V.S.
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Gritsenko D.V.
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Shaimeev S.S.
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Fedosenko E.V.
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Rykhlitski S.V.
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Atuchin V.V.
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Wong H.
Electronic Structure and Charge Transport Properties of Amorphous Ta2O5 Films
Journal of Non-Crystalline Solids. 2008.
V.354. N26. P.3025-3033. DOI: 10.1016/j.jnoncrysol.2007.12.013
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19
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Atuchin V.V.
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Aliev V.S.
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Kruchinin V.N.
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Ramana C.V.
Optical Properties and Micromorphology of ZrO2/Si Films Created by Ion Beam Sputtering Deposition
Фундаментальные проблемы современного материаловедения. 2007.
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Gritsenko V.
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Aliev V.
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Erenburg S.
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Tapilin V.
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Wong H.
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Lee J.H.
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Lee J.-W.
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Kim C.W.
Atomic and Electronic Structures of Amorphous ZrO2 and HfO 2 Films
Microelectronic Engineering. 2005.
V.81. N2-4. P.524-529. DOI: 10.1016/j.mee.2005.03.056
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21
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Aliev V.S.
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Baklanov M.R.
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Bukhtiyarov V.I.
Silicon Surface Cleaning Using XeF2 Gas Treatment
Applied Surface Science. 1995.
V.90. N2. P.191-194. DOI: 10.1016/0169-4332(95)00072-0
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