Chin Albert | Sciact - CRIS-system of Boreskov Institute of Catalysis - publications, employee

Chin Albert

Identifiers

AuthorIdentifierType.RESEARCHER_ID: AAM-4155-2020

AuthorIdentifierType.ORCID: 0000-0001-6790-2437

Affiliations

#	Name	Period	Items
1	National Chiao Tung University	2015 - 2019	6

Science activity

Articles in journal - 4 , Monography chapters - 1

Articles in journal (4) More info

1	Gismatulin A.A. , Kruchinin V.N. , Gritsenko V.A. , Prosvirin I.P. , Yen T.-J. , Chin A. Charge Transport Mechanism of High-Resistive State in RRAM Based on SiOx Applied Physics Letters. 2019. V.114. N3. 033503 :1-5. DOI: 10.1063/1.5074116 PublicationIdentifierType_short.SCOPUS PublicationIdentifierType_short.WOS PublicationIdentifierType_short.RINZ PublicationIdentifierType_short.AN: 2019:196777
2	Gritsenko V.A. , Kruchinin V.N. , Prosvirin I.P. , Novikov Y.N. , Chin A. , Volodin V.A. Atomic and Electronic Structures of a-SiNx:H Journal of Experimental and Theoretical Physics. 2019. V.129. N5. P.924-934. DOI: 10.1134/S1063776119080132 PublicationIdentifierType_short.SCOPUS PublicationIdentifierType_short.WOS PublicationIdentifierType_short.AN: 2019:2469622
3	Islamov D.R. , Kruchinin V.N. , Aliev V.S. , Perevalov T.V. , Gritsenko V.A. , Prosvirin I.P. , Orlov O.M. , Chin A. Potential Fluctuation in RRAM Based on Non-Stoichiometric Hafnium Sub-Oxides Advances in Science and Technology. 2016. V.99. P.69-74. DOI: 10.4028/www.scientific.net/ast.99.69
4	Kruchinin V.N. , Aliev V.S. , Perevalov T.V. , Islamov D.R. , Gritsenko V.A. , Prosvirin I.P. , Cheng C.H. , Chin A. Nanoscale Potential Fluctuation in Non-Stoichiometric HfOx and Low Resistive Transport in RRAM Microelectronic Engineering. 2015. V.147. P.165-167. DOI: 10.1016/j.mee.2015.04.091 PublicationIdentifierType_short.WOS PublicationIdentifierType_short.SCOPUS PublicationIdentifierType_short.RINZ PublicationIdentifierType_short.AN: 2015:710806

Monography chapters (1) More info

1

Islamov D.R. , Perevalov T.V. , Gritsenko V.A. , Aliev V.S. , Saraev A.A. , Kaichev V.V. , Ivanova E.V. , Zamoryanskaya M.V. , Chin A.
20 – The Nature of Defects Responsible for Transport in a Hafnia-Based Resistive Random Access Memory Element
Monography chapter Advances in Semiconductor Nanostructures: Growth, Characterization, Properties and Applications. – Elsevier Inc., 2016. – C.493-504. – ISBN 9780128105122. DOI: 10.1016/B978-0-12-810512-2.00020-2 PublicationIdentifierType_short.WOS PublicationIdentifierType_short.SCOPUS PublicationIdentifierType_short.RINZ PublicationIdentifierType_short.AN: 2019:2498278