Wong Hei | Sciact - cris system

Wong Hei

Identifiers

author_identifier.scopus_author_identifier_type: 55805848500

Affiliations

#	Name	Period	Items
1	City University of Hong Kong	2002 - 2008	5
2	Chinese University of Hong Kong	2003	2

Science activity

Articles in journal - 6

Articles in journal (6) More info

1	Shvets V.A. , Aliev V.S. , Gritsenko D.V. , Shaimeev S.S. , Fedosenko E.V. , Rykhlitski S.V. , Atuchin V.V. , Gritsenko V.A. , Tapilin V.M. , Wong H. Electronic Structure and Charge Transport Properties of Amorphous Ta2O5 Films Journal of Non-Crystalline Solids. 2008. V.354. N26. P.3025-3033. DOI: 10.1016/j.jnoncrysol.2007.12.013 publication_identifier_short.wos_identifier_type publication_identifier_short.scopus_identifier_type publication_identifier_short.rinz_identifier_type
2	Gritsenko V. , Gritsenko D. , Shaimeev S. , Aliev V. , Nasyrov K. , Erenburg S. , Tapilin V. , Wong H. , Poon M.C. , Lee J.H. , Lee J.-W. , Kim C.W. Atomic and Electronic Structures of Amorphous ZrO2 and HfO 2 Films Microelectronic Engineering. 2005. V.81. N2-4. P.524-529. DOI: 10.1016/j.mee.2005.03.056 publication_identifier_short.wos_identifier_type publication_identifier_short.scopus_identifier_type publication_identifier_short.rinz_identifier_type
3	Gritsenko V.A. , Shaposhnikov A.V. , Novikov Y.N. , Baraban A.P. , Wong H. , Zhidomirov G.M. , Roger M. Onefold Coordinated Oxygen Atom: An Electron Trap in the Silicon Oxide Microelectronics Reliability. 2003. V.43. N4. P.665-669. DOI: 10.1016/S0026-2714(03)00030-1 publication_identifier_short.wos_identifier_type publication_identifier_short.scopus_identifier_type publication_identifier_short.rinz_identifier_type
4	Gritsenko V.A. , Novikov Y.N. , Shaposhnikov A.V. , Wong H. , Zhidomirov G.M. Capturing Properties of a Threefold Coordinated Silicon Atom in Silicon Nitride: Positive Correlation Energy Model Physics of the Solid State. 2003. V.45. N11. P.2031-2035. DOI: 10.1134/1.1626733 publication_identifier_short.wos_identifier_type publication_identifier_short.scopus_identifier_type publication_identifier_short.rinz_identifier_type
5	Gritsenko V.A. , Shaposhnikov A.V. , Kwok W.M. , Wong H. , Jidomirov G.M. Valence Band Offset at Silicon/Silicon Nitride and Silicon Nitride/Silicon Oxide Interfaces Thin Solid Films. 2003. V.437. N1-2. P.135-139. DOI: 10.1016/S0040-6090(03)00601-1 publication_identifier_short.wos_identifier_type publication_identifier_short.scopus_identifier_type publication_identifier_short.rinz_identifier_type
6	Gritsenko V.A. , Novikov Y.N. , Shaposhnikov A.V. , Wong H. , Zhidomirov G.M. Capturing Properties of Three-Fold Coordinated Silicon Atom in Silicon Nitride: A Positive Correlation Energy Model Физика твердого тела. 2003. V.45. N11. P.1934-1937. publication_identifier_short.rinz_identifier_type