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1
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Shvets V.A.
,
Aliev V.S.
,
Gritsenko D.V.
,
Shaimeev S.S.
,
Fedosenko E.V.
,
Rykhlitski S.V.
,
Atuchin V.V.
,
Gritsenko V.A.
,
Tapilin V.M.
,
Wong H.
Electronic Structure and Charge Transport Properties of Amorphous Ta2O5 Films
Journal of Non-Crystalline Solids. 2008.
V.354. N26. P.3025-3033. DOI: 10.1016/j.jnoncrysol.2007.12.013
WOS
Scopus
РИНЦ
AN: 2008:575174
CAN: 149:138441
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2
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Gritsenko V.
,
Gritsenko D.
,
Shaimeev S.
,
Aliev V.
,
Nasyrov K.
,
Erenburg S.
,
Tapilin V.
,
Wong H.
,
Poon M.C.
,
Lee J.H.
,
Lee J.-W.
,
Kim C.W.
Atomic and Electronic Structures of Amorphous ZrO2 and HfO 2 Films
Microelectronic Engineering. 2005.
V.81. N2-4. P.524-529. DOI: 10.1016/j.mee.2005.03.056
WOS
Scopus
РИНЦ
AN: 2005:733450
CAN: 144:264300
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3
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Gritsenko V.A.
,
Novikov Y.N.
,
Shaposhnikov A.V.
,
Wong H.
,
Zhidomirov G.M.
Capturing Properties of Three-Fold Coordinated Silicon Atom in Silicon Nitride: A Positive Correlation Energy Model
Физика твердого тела. 2003.
V.45. N11. P.1934-1937.
РИНЦ
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4
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Gritsenko V.A.
,
Novikov Y.N.
,
Shaposhnikov A.V.
,
Wong H.
,
Zhidomirov G.M.
Capturing Properties of a Threefold Coordinated Silicon Atom in Silicon Nitride: Positive Correlation Energy Model
Physics of the Solid State. 2003.
V.45. N11. P.2031-2035. DOI: 10.1134/1.1626733
WOS
Scopus
РИНЦ
AN: 2003:896620
CAN: 140:187802
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5
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Gritsenko V.A.
,
Shaposhnikov A.V.
,
Kwok W.M.
,
Wong H.
,
Jidomirov G.M.
Valence Band Offset at Silicon/Silicon Nitride and Silicon Nitride/Silicon Oxide Interfaces
Thin Solid Films. 2003.
V.437. N1-2. P.135-139. DOI: 10.1016/S0040-6090(03)00601-1
WOS
Scopus
РИНЦ
AN: 2003:539403
CAN: 139:314997
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6
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Gritsenko V.A.
,
Shaposhnikov A.V.
,
Novikov Y.N.
,
Baraban A.P.
,
Wong H.
,
Zhidomirov G.M.
,
Roger M.
Onefold Coordinated Oxygen Atom: An Electron Trap in the Silicon Oxide
Microelectronics Reliability. 2003.
V.43. N4. P.665-669. DOI: 10.1016/S0026-2714(03)00030-1
WOS
Scopus
РИНЦ
AN: 2003:380541
CAN: 140:102658
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