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Ramana C.V.
,
Utsunomiya S.
,
Ewing R.
,
Becker U.
,
Atuchin V.V.
,
Aliev V.S.
,
Kruchinin V.N.
Spectroscopic Ellipsometry Characterization of the Optical Properties and Thermal Stability of Zr O2 Films Made by Ion-Beam Assisted Deposition
Applied Physics Letters. 2008.
V.92. N1. P.011917. DOI: 10.1063/1.2811955
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