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The Structure, Energetics, and Reactivity of Extended Defects of Copper Oxide Научная публикация

Общее Язык: Английский, Жанр: Статья (Full article),
Статус опубликования: Опубликована, Оригинальность: Оригинальная
Журнал Journal of Solid State Chemistry
ISSN: 0022-4596 , E-ISSN: 1095-726X
Вых. Данные Год: 1988, Том: 74, Номер: 1, Страницы: 200-208 Страниц : 9 DOI: 10.1016/0022-4596(88)90347-7
Авторы Sadykov V.A. 1 , Tikhov S.F. 1 , Kryukova G.N. 1 , Bulgakov N.N. 1 , Popovskii V.V. 1 , Kolomiichuk V.N. 1
Организации
1 Institute of Catalysis, Siberian Branch of the USSR Academy of Sciences

Реферат: For a discrimination of extended defects of copper oxide in terms of their stability and reactivity a sample of CuO was annealed in the vacuum thermochamber of an electron microscope and in a stream of helium at 200–400°C. The relaxation of the defect structure was studied by electron microscopy and X-ray small-angle scattering. The removal of oxygen from copper oxide was accompanied by rapid disappearance of microstrains. Simultaneously, the development of a dislocation network and the rearrangement of twins enhanced the reactivity of the oxide (the rates of reduction by CO and catalytic oxidation of CO by O2). Therefore, the active centers of the surface may be associated with dislocations and twins. One of the reasons for high reactivity of such defect centers is that they stabilize the highly reactive weakly bound oxygen.
Библиографическая ссылка: Sadykov V.A. , Tikhov S.F. , Kryukova G.N. , Bulgakov N.N. , Popovskii V.V. , Kolomiichuk V.N.
The Structure, Energetics, and Reactivity of Extended Defects of Copper Oxide
Journal of Solid State Chemistry. 1988. V.74. N1. P.200-208. DOI: 10.1016/0022-4596(88)90347-7 WOS Scopus РИНЦ
Даты:
Поступила в редакцию: 5 янв. 1987 г.
Принята к публикации: 28 сент. 1987 г.
Опубликована в печати: 1 мая 1988 г.
Опубликована online: 10 мая 2006 г.
Идентификаторы:
Web of science WOS:A1988N642200025
Scopus 2-s2.0-0024012548
РИНЦ 31445677
Chemical Abstracts 1988:539475
Chemical Abstracts (print) 109:139475
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