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A Continuous Electron Density Approach in Rietveld Analysis for Structure Investigations of the Mesoporous Silicate Materials Научная публикация

Общее Язык: Английский, Жанр: Статья (Full article),
Статус опубликования: Опубликована, Оригинальность: Оригинальная
Конференция 49th Annual Denver X-ray Conference
31 июл. - 4 авг. 2000 , Denver, Colorado
Журнал Advances in X-Ray Analysis
ISSN: 0376-0308
Вых. Данные Год: 2001, Том: 44, Страницы: 110-115 Страниц : 6
Авторы Solovyov L.A. 1 , Kirik S.D. 1 , Shmakov A.N. 2 , Romannikov V.N. 2
Организации
1 Institute of Chemistry and Chemical Engineering, K.Marx str., 42, Krasnoyarsk 660049, Russia
2 Boreskov Institute of Catalysis, Novosibirsk 630090, Russia

Информация о финансировании (1)

1 International Association for the Promotion of Co-operation with Scientists from the New Independent States of the Former Soviet Union IR-97-0676

Реферат: A procedure of the structure factor simulation from a continuous electron density representation in combination with the full-profile structure refinement (Rietveld technique) was developed and applied to structural characterization of pure siliceous mesoporous mesophase materials C16-SiO2-MMM of the MCM-41 type. An analytical function was exploited to simulate the continuous electron density. The function arguments were used as refinable structure parameters. The technique allows both the least-squares refinement of structural parameters using the fullprofile fitting and the E-map calculations providing additional information on the structure details. Determined pore sizes were in good agreement with those obtained by independent absorption-based method. The pore shape was found to be close to hexagonal geometry.
Библиографическая ссылка: Solovyov L.A. , Kirik S.D. , Shmakov A.N. , Romannikov V.N.
A Continuous Electron Density Approach in Rietveld Analysis for Structure Investigations of the Mesoporous Silicate Materials
Advances in X-Ray Analysis. 2001. V.44. P.110-115. РИНЦ
Идентификаторы:
РИНЦ 29250798
Chemical Abstracts 2002:385931
Chemical Abstracts (print) 137:50911