Analysis of Defect-Free Graphene Blocks in Nitrogen-Doped Bamboo-Like Carbon Nanotubes
Научная публикация
| Общее |
Язык:
Английский,
Жанр:
Статья (Full article),
Статус опубликования:
Опубликована,
Оригинальность:
Оригинальная
|
| Журнал |
Physica Status Solidi (B): Basic Research
ISSN: 0370-1972
, E-ISSN: 1521-3951
|
| Вых. Данные |
Год: 2018,
Том: 255,
Номер: 1,
Номер статьи
: 1700253,
Страниц
: 6
DOI:
10.1002/pssb.201700253
|
| Ключевые слова |
carbon nanotubes, defects, doping, nitrogen, Raman spectroscopy |
| Авторы |
Podyacheva Olga Yu.
1,2
,
Suboch Arina N.
1,2
,
Bokova-Sirosh Sofya N.
3,4
,
Romanenko Anatoly I.
5
,
Kibis Lidiya S.
1,2
,
Obraztsova Elena D.
3,4
,
Kuznetsov Vladimir L.
1,2
|
| Организации |
| 1 |
Boreskov Institute of Catalysis SB RAS, Lavrentieva ave. 5, Novosibirsk 630090, Russia
|
| 2 |
Novosibirsk State University, Pirogova str. 2, Novosibirsk 630090, Russia
|
| 3 |
A. M. Prokhorov General Physics Institute RAS, 38 Vavilova str., Moscow 119991, Russia
|
| 4 |
National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoye shosse 31, Moscow 115409, Russia
|
| 5 |
Nikolaev Institute of Inorganic Chemistry SB RAS, Lavrentieva ave. 3, Novosibirsk 630090, Russia
|
|
Информация о финансировании (1)
|
1
|
Федеральное агентство научных организаций России
|
0303-2016-0003
|
The structure and electronic properties of the N-doped bamboo-like carbon nanotubes with different nitrogen content (N-CNTs) are studied by the use of transmission electron microscopy, electron energy loss spectroscopy, Raman spectroscopy, and X-ray photoelectron spectroscopy supplemented by measurements of the temperature dependence of conductivity. XPS data are used to estimate the content of nitrogen represented by pyridinic, pyrrolic, graphitic, and oxidized N species and encapsulated molecular nitrogen. The graphene blocks surrounded by borders containing hole defects and N-species are considered as building blocks of N-CNT walls. The intensity ratio of D, G, and 2D bands in Raman spectra and XPS data on the concentration of N-species are used to analyze the size of defect-free graphene blocks in N-CNTs. The size of such blocks depends on the N-defect content and is estimated to be 1–2 nm. The increase of N-species content resulting in a decrease of graphene block size correlates with the decrease of current carrier concentration (nES) estimated within the Efros–Shklovskii model.