X-Ray Structural Modeling of Silicate Mesoporous Mesophase Material
Научная публикация
Общее |
Язык:
Английский,
Жанр:
Статья (Full article),
Статус опубликования:
Опубликована,
Оригинальность:
Оригинальная
|
Конференция |
Mesoporous Molecular Sieves : 2nd International Symposium
27 авг. - 2 сент. 2000
,
Quebec City
|
Журнал |
Microporous and Mesoporous Materials
ISSN: 1387-1811
, E-ISSN: 1873-3093
|
Вых. Данные |
Год: 2001,
Том: 44-45,
Страницы: 17-23
Страниц
: 7
DOI:
10.1016/S1387-1811(01)00164-0
|
Ключевые слова |
Electron density distribution, Rietveld's technique, Silicate mesoporous material, Wall structure, X-ray modeling |
Авторы |
Solovyov L.A.
1
,
Kirik S.D.
1
,
Shmakov A.N.
2
,
Romannikov V.N.
2
|
Организации |
1 |
Institute of Chemistry and Chemical Engineering, K. Marx Avenue, 42, Krasnoyarsk 660049, Russian Federation
|
2 |
Boreskov Institute of Catalysis, Novosibirsk 630090, Russian Federation
|
|
Информация о финансировании (1)
1
|
International Association for the Promotion of Co-operation with Scientists from the New Independent States of the Former Soviet Union
|
IR-97-0676
|
Rietveld’s technique in combination with a continuous electron density representation was applied to structural modeling of highly ordered pure siliceous mesoporous mesophase material C16-SiO2-MMM of the MCM-41 type prepared by hydrothermal synthesis in the presence of C16H33N(CH3)3Br. Several important characteristics of the material in both as-synthesized and calcined forms were revealed. In particular, it was found that mesopores in the materials are of true hexagonal shape, and the wall electron density seems to be not continuous.