Investigation of Roughness Cross Correlation in a Ni/C Multilayer Mirror by X-Ray Diffuse Scattering Method
Научная публикация
| Общая информация |
Язык:
Английский,
Жанр:
Статья (Full article),
Статус опубликования:
Опубликована,
Оригинальность:
Переводная
|
| Журнал |
Journal of Experimental and Theoretical Physics
ISSN: 1063-7761
, E-ISSN: 1090-6509
|
| Вых. Данные |
Год: 2003,
Том: 97,
Номер: 6,
Страницы: 1201-1211
Страниц
: 11
DOI:
10.1134/1.1641902
|
| Авторы |
Kovalenko N.V.
1
,
Mytnichenko S.V.
2
,
Chernov V.A.
3
|
| Организации |
| 1 |
Budker Institute of Nuclear Physics, Siberian Division, Russian Academy of Sciences, pr. Akademika Lavrent’eva 11, Novosibirsk, 630090 Russia
|
| 2 |
Institute of Solid-State Chemistry and Mechanochemistry, Siberian Division, Russian Academy of Sciences, Novosibirsk, 630128 Russia
|
| 3 |
Boreskov Institute of Catalysis, Siberian Division, Russian Academy of Sciences, pr. Akademika Lavrent’eva 5, Novosibirsk, 630090 Russia
|
|
Информация о финансировании (2)
|
1
|
Российский фонд фундаментальных исследований
|
03-02-16259
|
|
2
|
Сибирское отделение Российской академии наук
|
|
The possibility of applying X-ray diffuse scattering for studying roughness in multilayer X-ray mirrors, including the correlation of roughnesses of neighboring interfaces (roughness cross-correlation) is considered. It is shown that the reliability and informativeness of this method can be improved by rejecting the classical experimental schemes and using alternative schemes in which not only the intensity of diffuse scattering itself, but also its dependence on certain experimental parameters (conditions), vary. Such parameters can be the spatial coherence of incident radiation, the direction of the momentum transfer relative to the specular diffraction plane, or the X-ray wavelength. In the framework of this approach, the results of comparative measurements of diffuse scattering from a Ni/C multilayer X-ray mirror prepared by laser ablation are considered for two close values of photon energy: below (8.325 keV) and above (8.350 keV) the K absorption edge for nickel. It is shown that, in view of effective screening of deep layers in the hard photoabsorption mode, this method provides more reliable (as compared to the standard diffuse scattering method) information on the evolution of interfaces between the layers. It is found that the smoothing of roughness in the experimental sample occurs over large spatial scales such as the micrometer scale. Only large-scale defects with a size exceeding 10 µm are replicated well from layer to layer. Possible physical reasons for the observed effect are considered. It is shown that effective smoothing on the micrometer and submicrometer spatial scales is of fundamental importance for preparing multilayer X-ray mirrors with high reflectances.