The Application of the X-Ray Standing Wave Method to Study Ni/C Layered Structures Obtained by Laser-Assisted Deposition Full article
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10th National Synchrotron Radiation Conference 11-15 Jul 1994 , Новосибирск |
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| Journal |
Nuclear Instruments and Methods in Physics Research Section A
ISSN: 0168-9002 |
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| Output data | Year: 1995, Volume: 359, Number: 1-2, Pages: 175-177 Pages count : 3 DOI: 10.1016/0168-9002(94)01693-3 | ||||
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Abstract:
The X-ray standing wave method using fluorescence yield mode was applied to study the profile of the component-by-component distribution between Ni and C layers in NiC layered structures produced by laser-assisted deposition. The method of recurrent relationships was used to calculate the standing wave electric field profile, and to reconstruct the Ni deep distribution. Best fitting was obtained if the intermixing thickness was equal to 3–4 Å.
Cite:
Chernov V.A.
, Chkhalo N.I.
, Dolbnya I.P.
, Zolotarev K.V.
The Application of the X-Ray Standing Wave Method to Study Ni/C Layered Structures Obtained by Laser-Assisted Deposition
Nuclear Instruments and Methods in Physics Research Section A. 1995. V.359. N1-2. P.175-177. DOI: 10.1016/0168-9002(94)01693-3 WOS Scopus РИНЦ ANCAN OpenAlex
The Application of the X-Ray Standing Wave Method to Study Ni/C Layered Structures Obtained by Laser-Assisted Deposition
Nuclear Instruments and Methods in Physics Research Section A. 1995. V.359. N1-2. P.175-177. DOI: 10.1016/0168-9002(94)01693-3 WOS Scopus РИНЦ ANCAN OpenAlex
Dates:
| Published print: | May 1, 1995 |
| Published online: | Feb 23, 2000 |
Identifiers:
| Web of science: | WOS:A1995QY84500042 |
| Scopus: | 2-s2.0-4243488525 |
| Elibrary: | 30935266 |
| Chemical Abstracts: | 1995:539469 |
| Chemical Abstracts (print): | 122:325420 |
| OpenAlex: | W2070376755 |