ARXPS-Based Concentration Profiles Restoration Applied to Adsorbate/Metal Systems Full article
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Surface Science
ISSN: 0039-6028 |
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| Output data | Year: 1992, Volume: 271, Number: 3, Pages: 493-500 Pages count : 8 DOI: 10.1016/0039-6028(92)90910-X | ||||
| Tags | RAY PHOTOELECTRON-SPECTROSCOPY; IONIZATION CROSS-SECTIONS; ENERGY ELECTRON-DIFFRACTION; BORN APPROXIMATION; CARBON-MONOXIDE; SURFACE; OXYGEN; ESCA; CHEMISORPTION; ETHYLENE | ||||
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Abstract:
Depth concentration profiles for the O2/Ir(111), CO/Ir(111) and O2/Ag adsorbate/metal systems have been obtained by means of the numerical analysis of the ARXPS data. For the O2/Ir(111) and CO/Ir(111) systems our technique has been found to yield correct coverage estimates and elements in-depth distributions with near-atomic resolution. For the O2/Ag system the oxygen atoms with E(BO 1s) = 528.4 eV have been shown to incorporate between two upper substrate layers, while being completely absent on the surface. The oxygen atoms with E(BO 1s) = 530.5 eV behave quite differently, being present both upon the surface and in the outermost substrate layer.
Cite:
Baschenko O.A.
, Bukhtiyarov V.I.
, Boronin A.I.
ARXPS-Based Concentration Profiles Restoration Applied to Adsorbate/Metal Systems
Surface Science. 1992. V.271. N3. P.493-500. DOI: 10.1016/0039-6028(92)90910-X WOS Scopus РИНЦ ANCAN OpenAlex
ARXPS-Based Concentration Profiles Restoration Applied to Adsorbate/Metal Systems
Surface Science. 1992. V.271. N3. P.493-500. DOI: 10.1016/0039-6028(92)90910-X WOS Scopus РИНЦ ANCAN OpenAlex
Dates:
| Submitted: | Aug 12, 1991 |
| Accepted: | Dec 10, 1991 |
| Published print: | Jan 1, 1992 |
| Published online: | Sep 25, 2002 |
Identifiers:
| Web of science: | WOS:A1992JA63900022 |
| Scopus: | 2-s2.0-0026882334 |
| Elibrary: | 31146785 |
| Chemical Abstracts: | 1992:456604 |
| Chemical Abstracts (print): | 117:56604 |
| OpenAlex: | W2024945738 |