Simulation of X-ray Powder Diffraction Patterns for One-dimensionally Disordered Crystals Научная публикация
| Конференция |
8th European Powder Diffraction Conference 23-26 мая 2002 , Uppsala |
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| Сборник | EPDIC 8 : Proceedings of the 8th European Powder Diffraction Conference, Uppsala, Sweden, May 23-26, 2002 Сборник, Trans Tech Publications. Zurich.2004. 440 c. ISBN 9780878499359. |
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| Журнал |
Materials Science Forum
ISSN: 0255-5476 , E-ISSN: 1662-9752 |
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| Вых. Данные | Год: 2004, Том: 443-444, Страницы: 87-90 Страниц : 4 DOI: 10.4028/www.scientific.net/MSF.443-444.87 | ||
| Ключевые слова | Defects, Simulation, X-Ray Powder Diffraction | ||
| Авторы |
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| Организации |
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Реферат:
Software for the simulation of X-ray powder diffraction (XRPD) patterns for ultrafinegrained materials with some kinds of imperfections has been developed. These calculations are performed on the base of the model of one-dimensionally disordered (1D-disordered) crystal [1]. Such a model can describe stacking faults (SF) and other planar defects (PD) and also finite size of coherently scattering domains. Simulated XRPD pattern is compared with experimental one and can be fitted to it. Potentialities of the software are illustrated by several examples.
Библиографическая ссылка:
Cherepanova S.V.
, Tsybulya S.V.
Simulation of X-ray Powder Diffraction Patterns for One-dimensionally Disordered Crystals
В сборнике EPDIC 8 : Proceedings of the 8th European Powder Diffraction Conference, Uppsala, Sweden, May 23-26, 2002. – Trans Tech Publications., 2004. – C.87-90. – ISBN 9780878499359. DOI: 10.4028/www.scientific.net/MSF.443-444.87 WOS Scopus РИНЦ CAPlusCA OpenAlex
Simulation of X-ray Powder Diffraction Patterns for One-dimensionally Disordered Crystals
В сборнике EPDIC 8 : Proceedings of the 8th European Powder Diffraction Conference, Uppsala, Sweden, May 23-26, 2002. – Trans Tech Publications., 2004. – C.87-90. – ISBN 9780878499359. DOI: 10.4028/www.scientific.net/MSF.443-444.87 WOS Scopus РИНЦ CAPlusCA OpenAlex
Идентификаторы БД:
| Web of science: | WOS:000189421300016 |
| Scopus: | 2-s2.0-17644433991 |
| РИНЦ: | 23982515 |
| Chemical Abstracts: | 2004:163391 |
| Chemical Abstracts (print): | 141:286260 |
| OpenAlex: | W2048750709 |