Project of in situ Pulsed-Laser-Deposition for X-ray Scattering Studies at VEPP-3 Beamline 6th-TOP | Sciact - CRIS-system of Boreskov Institute of Catalysis

Project of in situ Pulsed-Laser-Deposition for X-ray Scattering Studies at VEPP-3 Beamline 6th-TOP Conference Abstracts

Conference

XVI International Synchrotron Radiation Conference
10-14 Jul 2006 , Novosibirsk

Source

XVI international synchrotron radiation conference SR-2006: 10-14 July 2006, Novosibirsk, Russia : Digest reports
Compilation, 2006. 198 c. РИНЦ

Output data

Year: 2006, Pages: 159 Pages count : 1

Authors

Zhogin I.L. ¹ , Vratskikh V.F. ^2,3 , Rykov A.I. ^2,3 , Gavrilov N.G. ³ , Shmakov A.N. ⁴ , Tolochko B.P. ¹ , Lyakhov N.Z. ¹ , Sharafudinov M.R. ¹ , Evdokov O.V. ¹ , Kovalenko N.V. ³ , Sheromov M.A. ³

Affiliations

1	Institute of Solid State Chemistry and Mechanochemistry SB RAS, Novosibirsk, Russia
2	Siberian Synchrotron Radiation Center, Novosibirsk, Russia
3	Budker Institute of Nuclear physics SB RAS, Novosibirsk, Russia
4	Institute of Catalysis SB RAS, Novosibirsk, Russia

Epitaxial growth and research in oxide films and multilayers are increasingly becoming important in view of recent discoveries of unique properties in oxides: high-Tc of ferromagnetism and superconductivity in dilute magnetic semiconductors (DMS), manganites, cuprates, etc. Although many films, including single layers and multistructures of these classes of materials (superconducting, ferroelectric, magnetoresistive etc.) were richly obtained in last years, emerging spintronics technologies need better benefits from involved physics and material science. Combining in multilayers the different materials from these families allows one to obtain the elements with novel properties for high-technology integrated structures. These objectives request us create the new and improved methods of handling the growth process with the help of fast x-ray difractometry. Development of the in-situ time-resolved diagnostic technique, the strategic tools for direct control of heteroepitaxially growing structures, is the main neck-stage limiting our understanding of science underlying oxide-device architectonics. Pulsed laser deposition (PLD) is the conceptually simplest and best material-versatile technique. Depending on PLD regimes, film growth proceeds in various modes, such as 3D, layer by layer, or step flow. Emphasis in the studies will be put on control of strained growth, relaxation of mechanical stress, surface/interface reconstruction, with the help of crystal-truncation-rod scattering, using grazing incidence condition in diffraction and reflectometry.

Zhogin I.L. , Vratskikh V.F. , Rykov A.I. , Gavrilov N.G. , Shmakov A.N. , Tolochko B.P. , Lyakhov N.Z. , Sharafudinov M.R. , Evdokov O.V. , Kovalenko N.V. , Sheromov M.A.
Project of in situ Pulsed-Laser-Deposition for X-ray Scattering Studies at VEPP-3 Beamline 6th-TOP
In compilation XVI international synchrotron radiation conference SR-2006: 10-14 July 2006, Novosibirsk, Russia : Digest reports. 2006. – C.159. РИНЦ

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