“Electronic Structure” Beamline 1-6 at SKIF Synchrotron Facility | Sciact - CRIS-system of Boreskov Institute of Catalysis

“Electronic Structure” Beamline 1-6 at SKIF Synchrotron Facility Full article

Conference

International Conference "Synchrotron and Free electron laser Radiation: generation and application"
13-17 Jul 2020 , Novosibirsk

Journal

AIP Conference Proceedings
ISSN: 0094-243X , E-ISSN: 1551-7616

Output data

Year: 2020, Volume: 2299, Number: 1, Article number : 060003, Pages count : 5 DOI: 10.1063/5.0030740

Authors

Bukhtiyarov Andrey V. ¹ , Bukhtiyarov Valery I. ¹ , Nikolenko Anton D. ^1,2 , Prosvirin Igor P. ¹ , Kvon Ren I. ¹ , Tereshchenko Oleg E. ³

Affiliations

1	Boreskov Institute of Catalysis SB RAS
2	Rzhanov Institute of Semiconductor Physics, SB RAS
3	Budker Institute of Nuclear Physics, SB RAS

Funding (1)

Ministry of Science and Higher Education of the Russian Federation

05.621.21.0022 (RFMEFI62119X0022) (АААА-А20-120072290017-9)

SKIF is a synchrotron facility to be commissioned in 2024. One of the six beamlines planned to be built in the first phase is the "Electronic Structure" beamline. Now three branch lines are funded, which will host the endstations for Near Ambient Pressure X-Ray Photoelectron Spectroscopy (NAP XPS), Spin-Angle Resolved Photo-Emission Spectroscopy (Spin-ARPES), and Reflectometry and Metrology. The current work presents the conceptual design of the "Electronic Structure" beamline. The NAP XPS endstation will enable in situ and operando studies of a wide range of catalytic systems and in situ studies of regularities of deactivation/poisoning processes for catalytic systems depending on different conditions and of innovative functional materials. Another important technique that will be realized on the beamline (another branch line) involves the Spin-Angle Resolved Photo-Emission Spectroscopy (Spin-ARPES) endstation, which will enable study of the electronic and spin structure of solids for applications in nanoelectronics and spintronics. The third endstation, Reflectometry and Metrology (the third branch line), will be used for certification of spectral optical elements, focusing elements, and X-ray detectors. For absolute calibration of the spectral sensitivity of detectors, reference detector techniques will be implemented. Both a secondary reference detector (silicon photodiode) and a primary one (HTSC superconducting bolometer) will be used as a reference one.

Bukhtiyarov A.V. , Bukhtiyarov V.I. , Nikolenko A.D. , Prosvirin I.P. , Kvon R.I. , Tereshchenko O.E.
“Electronic Structure” Beamline 1-6 at SKIF Synchrotron Facility

AIP Conference Proceedings. 2020. V.2299. N1. 060003 :1-5. DOI: 10.1063/5.0030740 Scopus РИНЦ AN OpenAlex

Full text from publisher

Published print:	Nov 17, 2020
Published online:	Nov 17, 2020

Scopus:	2-s2.0-85096474355
Elibrary:	45130946
Chemical Abstracts:	2021:1074980
OpenAlex:	W3099804324

DB	Citing
Scopus	2
Elibrary	3
OpenAlex	6