Performance and Characterization of CsI:Tl thin Films for X-ray Imaging Application | Sciact - CRIS-system of Boreskov Institute of Catalysis

Performance and Characterization of CsI:Tl thin Films for X-ray Imaging Application Full article

Conference

The International Conference "Synchrotron and Free electron laser Radiation: generation and application"
04-07 Jul 2016 , Novosibirsk

Journal

Physics Procedia
ISSN: 1875-3892

Output data

Year: 2016, Volume: 84, Pages: 245-251 Pages count : 7 DOI: 10.1016/j.phpro.2016.11.042

Tags

high-resolution, CsI:Tl, thin scintillator films, X-ray imaging, vacuum deposition method, carbon layer

Authors

Kozyrev E.A. ^1,2 , Kuper K.E. ¹ , Lemzyakov A.G. ¹ , Petrozhitskiy A.V. ¹ , Popov A.S. ¹

Affiliations

1	Budker Institute of Nuclear Physics, SB RAS
2	Novosibirsk State University

High spatial resolution thin CsI:Tl scintillator films was prepared by thermal deposition method for X-ray imaging applications. We fabricated CsI:Tl scintillators ranging from 2 μm to 14 μm in thickness. We measured spacial resolution and light yield as a function of input photons energy (5-40 keV) and film thickness. To improve spatial resolution of films carbon post-deposition treatments was performed.

Kozyrev E.A. , Kuper K.E. , Lemzyakov A.G. , Petrozhitskiy A.V. , Popov A.S.
Performance and Characterization of CsI:Tl thin Films for X-ray Imaging Application

Physics Procedia. 2016. V.84. P.245-251. DOI: 10.1016/j.phpro.2016.11.042 WOS Scopus РИНЦ AN OpenAlex

Full text from publisher

Published online:

Dec 12, 2016

Web of science:	WOS:000392696400040
Scopus:	2-s2.0-85016281587
Elibrary:	29500846
Chemical Abstracts:	2016:2089566
OpenAlex:	W2562308432

DB	Citing
Web of science	6
Scopus	9
OpenAlex	11