Performance and Characterization of CsI:Tl thin Films for X-ray Imaging Application Full article
| Conference |
The International Conference "Synchrotron and Free electron laser Radiation: generation and application" 04-07 Jul 2016 , Novosibirsk |
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| Journal |
Physics Procedia
ISSN: 1875-3892 |
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| Output data | Year: 2016, Volume: 84, Pages: 245-251 Pages count : 7 DOI: 10.1016/j.phpro.2016.11.042 | ||||
| Tags | high-resolution, CsI:Tl, thin scintillator films, X-ray imaging, vacuum deposition method, carbon layer | ||||
| Authors |
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Abstract:
High spatial resolution thin CsI:Tl scintillator films was prepared by thermal deposition method for X-ray imaging applications. We fabricated CsI:Tl scintillators ranging from 2 μm to 14 μm in thickness. We measured spacial resolution and light yield as a function of input photons energy (5-40 keV) and film thickness. To improve spatial resolution of films carbon post-deposition treatments was performed.
Cite:
Kozyrev E.A.
, Kuper K.E.
, Lemzyakov A.G.
, Petrozhitskiy A.V.
, Popov A.S.
Performance and Characterization of CsI:Tl thin Films for X-ray Imaging Application
Physics Procedia. 2016.
V.84. P.245-251. DOI: 10.1016/j.phpro.2016.11.042
WOS
Scopus
РИНЦ
AN
OpenAlex
Performance and Characterization of CsI:Tl thin Films for X-ray Imaging Application
Physics Procedia. 2016.
V.84. P.245-251. DOI: 10.1016/j.phpro.2016.11.042
WOS
Scopus
РИНЦ
AN
OpenAlex
Files:
Full text from publisher
Dates:
| Published online: | Dec 12, 2016 |
Identifiers:
| Web of science: | WOS:000392696400040 |
| Scopus: | 2-s2.0-85016281587 |
| Elibrary: | 29500846 |
| Chemical Abstracts: | 2016:2089566 |
| OpenAlex: | W2562308432 |