XRF Microanalysis of Thick Objects | Sciact - CRIS-system of Boreskov Institute of Catalysis

XRF Microanalysis of Thick Objects Full article

Journal

AIP Conference Proceedings
ISSN: 0094-243X , E-ISSN: 1551-7616

Output data

Year: 2020, Volume: 2299, Article number : 060017, Pages count : 4 DOI: 10.1063/5.0030498

Authors

Nazmov V.P. ^1,2 , Legkodymov A.A. ¹ , Zhmodik S.M. ³ , Kulipanov G.N. ¹ , Pokhilenko N.P. ³

Affiliations

1	Budker Institute of Nuclear Physics, SB RAS, pr. Akad. Lavrent’eva 11, 630090, Novosibirsk, Russia
2	Solid State Chemistry and Mechanochemistry SB RAS Kutateladze 18, 630128 Novosibirsk, Russia
3	Sobolev Institute of Geology and Mineralogy SB RAS, pr. Koptyuga 3, 630090 Novosibirsk, Russia

The conditions for investigation of specimens by the micro XRF method on the existing SR source VEPP-4M and the prospective SR source SKIF are compared

Nazmov V.P. , Legkodymov A.A. , Zhmodik S.M. , Kulipanov G.N. , Pokhilenko N.P.
XRF Microanalysis of Thick Objects

AIP Conference Proceedings. 2020. V.2299. 060017 :1-4. DOI: 10.1063/5.0030498 Scopus РИНЦ OpenAlex

Full text from publisher

Published print:

Nov 17, 2020

Scopus:	2-s2.0-85096495787
Elibrary:	45172443
OpenAlex:	W3104733506

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