Abstract: Nowadays the method of XAFS spectroscopy in a different methodical options using of SR sources is a recognized powerful tool to study the state of the elements and the local structure for the various nanosystems having different aggregation: alloys, high dispersed material, semiconductors, solutions, glasses and others. In this report, by the example of works performed at the EXAFS station of SSTRC, for a variety of nanosized systems used in catalysis, materials science, biology, demonstrated the possibility of XAFS spectroscopy, as an independent method and in combination with other physical methods of research - HRTEM, XRD, XPS, SEM. The prospects of an integrated approach to study of nanostructured systems: dilute encapsulated ordered semiconductor nanostructures, nanocomposite catalysts having complex composition, biological nanomaterials and others are shown.

Cite: Kriventsov V.
Current Status of EXAFS Station of SSTRC. Application of XAFS Spectroscopy for the Study of Promising Functional Nanomaterials
In compilation Synchrotron and Free electron laser Radiation: generation and application (SFR-2016). Book of Abstracts. – BINP SB RAS., 2016. – C.85.

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