Abstract: Synchrotron radiation X-ray fluorescence (SXRF) spectrometry is an elemental analysis technique which allows for the examination of different materials. For many years, this technique has been used in the Siberian Synchrotron and Terahertz Radiation Centre of the Budker Institute of Nuclear Physics (Novosibirsk, Russia). Although the SXRF spectrometry is universal, it cannot detect all elements at general settings. It is therefore important to optimize the equipment in the synchrotron radiation spectrum and detection conditions. Routine measurement methodologies of the chemical element concentration (from potassium to uranium) are tested on the local X-ray fluorescence beamline installed downstream the synchrotron radiation from the VEPP-3 storage ring [1]. It emits an Xray energy spectrum between 12 and 25 keV. Hard radiation X-ray diffraction beamline installed on the VEPP-4 Ion Collider Facility [2], emits photons with an energy higher than 100 keV to use them for the excitation of fluorescence from rare-earth and heavy elements. Tentative measurements of light elements Al, Si, P, S, Cl (relevant for studying such plants as grass, roots, leaves, shoots, fruits) on these beamlines are not successful. The silicon (Si) distribution in plant parts is very interesting for studying the influence of Si-containing fertilizers and regulators on the plant growth and development [3]. At the excitation energy of 12 keV typical for the VEPP-3 storage ring, it is impossible to ensure a reliable estimate of the Si content in plant parts. This results from the fact that under routine experimental conditions at this beamline, the low-energy fluorescence radiation from light elements (e.g., 1.74 keV Si Kα X-ray) is significantly absorbed by the ambient air and the background radiation suppresses a valid signal. In this work, we call elements light and heavy, that are lighter (Z < 19) and heavier (Z ≥19) than potassium, respectively. The aim of this work is to consider the possibility of expanding the opportunities of using the SXRF spectrometry for detection of light elements in plants.

Cite: Gol’denberg B.G. , Gusev I.S. , Legkodymov A.A. , Kolmogorov Y.P.
Synchrotron Radiation Induced X-Ray Fluorescence for Identification of Light Elements in Plants
Russian Physics Journal. 2023. V.66. N10. P.1122–1127. DOI: 10.1007/s11182-023-03052-6 WOS Scopus РИНЦ AN OpenAlex

Dates:

Submitted:	Nov 9, 2023
Published online:	Dec 12, 2023

Identifiers:

Web of science:	WOS:001124013500001
Scopus:	2-s2.0-85179345134
Elibrary:	59936579
Chemical Abstracts:	2023:2602788
OpenAlex:	W4389623350

Citing:

DB	Citing
Scopus	1
Web of science	1

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