Application of Deep Machine Learning for Microscopy Image Analysis: Services for Automatic Search, Identification and Analysis of Objects Тезисы доклада
Конференция |
Microscopy – International School-Conference of Young Scientists 2023 13-17 нояб. 2023 , Сколтех |
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Сборник | 1st International School-Conference of Young Scientists 2023 "Microscopy of Materials". Book of Abstracts Сборник, Skoltech. Moscow.2023. 68 c. |
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Вых. Данные | Год: 2023, Страницы: 42-43 Страниц : 1 | ||||||
Авторы |
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Организации |
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Информация о финансировании (1)
1 | Российский научный фонд | 22-23-00951 |
Библиографическая ссылка:
Nartova A.V.
, Matveev A.V.
, Mashukov M.Y.
, Sankova N.N.
, Kudinov V.Y.
, Okunev A.G.
Application of Deep Machine Learning for Microscopy Image Analysis: Services for Automatic Search, Identification and Analysis of Objects
В сборнике 1st International School-Conference of Young Scientists 2023 "Microscopy of Materials". Book of Abstracts. – Skoltech., 2023. – C.42-43.
Application of Deep Machine Learning for Microscopy Image Analysis: Services for Automatic Search, Identification and Analysis of Objects
В сборнике 1st International School-Conference of Young Scientists 2023 "Microscopy of Materials". Book of Abstracts. – Skoltech., 2023. – C.42-43.
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