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Polycrystal Software Package for IBM/PC Full article

Journal Journal of Structural Chemistry
ISSN: 0022-4766 , E-ISSN: 1573-8779
Output data Year: 1996, Volume: 37, Number: 2, Pages: 332-334 Pages count : 3 DOI: 10.1007/BF02591064
Tags Integral Intensity; Interplanar Distance; Priority Rule; Symmetry Element; Reflection Index
Authors Tsybulya S.V. 1 , Cherepanova S.V. 1 , Solovʹeva L.P. 1
Affiliations
1 Boreskov Institute of Catalysis of the Siberian Branch of Russian Academy of Sciences

Funding (1)

1 Russian Foundation for Basic Research 93-03-04843

Abstract: A software package for X-ray diffraction studies of polycrystalline materials has been developed for IBM/PC. The system includes programs for calculating X-ray diffractograms, interatomic distances, and polyhedra, and also for refinement of lattice parameters and crystal structures by integral intensities of diffraction peaks.
Cite: Tsybulya S.V. , Cherepanova S.V. , Solovʹeva L.P.
Polycrystal Software Package for IBM/PC
Journal of Structural Chemistry. 1996. V.37. N2. P.332-334. DOI: 10.1007/BF02591064 WOS Scopus РИНЦ OpenAlex
Original: Цыбуля С.В. , Черепанова С.В. , Соловьева Л.П.
Система программ Поликристалл для IBM/PC
Журнал структурной химии. 1996. Т.37. №2. С.379-382. РИНЦ ANCAN
Dates:
Submitted: Mar 1, 1995
Published print: Mar 1, 1996
Identifiers:
Web of science: WOS:A1996VL83500022
Scopus: 2-s2.0-27544493201
Elibrary: 13222159
OpenAlex: W2071445773
Citing:
DB Citing
Web of science 47
Scopus 48
Elibrary 48
OpenAlex 43
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