Mechanism of the Ion Dimer Formation in Secondary Ion Mass Spectrometry Full article
| Journal |
International Journal of Mass Spectrometry (International Journal of Mass Spectrometry and Ion Processes up to 1998)
ISSN: 1387-3806 |
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| Output data | Year: 1999, Volume: 188, Number: 3, Pages: 183-187 Pages count : 5 DOI: 10.1016/S1387-3806(99)00036-6 | ||
| Tags | Ion dimer, Ion emission, Nickel, SIMS, Sputtering | ||
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Abstract:
The influence of temperature on the emission of the Ni2+ and Ni+ secondary ions has been investigated in the temperature range from 350 to 1100 K using secondary ion mass spectrometry. The ferroparamagnetic phase transition at T ≅ 620 K on nickel is found to strongly affect only the emission of Ni+ but not the emission of Ni2+. The data show that the Ni2+ dimers form via the ion–molecule recombination reaction in the near surface region rather than by a direct emission of the bound molecules.
Cite:
Ivanov V.P.
, Trukhan S.N.
, Borodin A.I.
Mechanism of the Ion Dimer Formation in Secondary Ion Mass Spectrometry
International Journal of Mass Spectrometry (International Journal of Mass Spectrometry and Ion Processes up to 1998). 1999. V.188. N3. P.183-187. DOI: 10.1016/S1387-3806(99)00036-6 WOS Scopus РИНЦ ANCAN OpenAlex
Mechanism of the Ion Dimer Formation in Secondary Ion Mass Spectrometry
International Journal of Mass Spectrometry (International Journal of Mass Spectrometry and Ion Processes up to 1998). 1999. V.188. N3. P.183-187. DOI: 10.1016/S1387-3806(99)00036-6 WOS Scopus РИНЦ ANCAN OpenAlex
Dates:
| Submitted: | Jul 1, 1997 |
| Accepted: | Jul 20, 1998 |
| Published online: | Jun 2, 1999 |
| Published print: | Jun 14, 1999 |
Identifiers:
| Web of science: | WOS:000080838100005 |
| Scopus: | 2-s2.0-9744252370 |
| Elibrary: | 13309534 |
| Chemical Abstracts: | 1999:386327 |
| Chemical Abstracts (print): | 131:108545 |
| OpenAlex: | W2006697094 |