Using Computer Vision and Deep Learning for Nanoparticle Recognition on Scanning Probe Microscopy Images: Modified U-net Approach Доклады на конференциях
Язык | Английский | ||||
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Тип доклада | Устный | ||||
Url доклада | https://ai.nsu.ru/saience2020/ | ||||
Конференция |
2020 Science and Artificial Intelligence Conference 14-15 нояб. 2020 , Novosibirsk |
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Организации |
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Библиографическая ссылка:
Nartova A.V.
, Okunev A.G.
, Matveev A.V.
, Liz M.F.
Using Computer Vision and Deep Learning for Nanoparticle Recognition on Scanning Probe Microscopy Images: Modified U-net Approach
2020 Science and Artificial Intelligence Conference 14-15 Nov 2020
Using Computer Vision and Deep Learning for Nanoparticle Recognition on Scanning Probe Microscopy Images: Modified U-net Approach
2020 Science and Artificial Intelligence Conference 14-15 Nov 2020