Source-Based Calibration of the Soft X-ray Detectors at the SSTRC - Conference attendances | Sciact - CRIS-system of Boreskov Institute of Catalysis

Source-Based Calibration of the Soft X-ray Detectors at the SSTRC Conference attendances

Language

Английский

Participant type

Стендовый

Conference

The International Conference "Synchrotron and Free electron laser Radiation: generation and application"
04-07 Jul 2016 , Novosibirsk

Authors

Nikolenko Anton Dmitrievich ¹ , Ivlyushkin Denis V. ¹ , Zavertkin Pavel S. ¹ , Mashkovtsev Mikhail Rudolfovich ¹ , Makarova Natalʹya ²

Affiliations

1	Budker Institute of Nuclear Physics SB RAS
2	Polzunov Altai State Technical University

Nikolenko A.D. , Ivlyushkin D.V. , Zavertkin P.S. , Mashkovtsev M.R. , Makarova N.
Source-Based Calibration of the Soft X-ray Detectors at the SSTRC
The International Conference "Synchrotron and Free electron laser Radiation: generation and application" 04-07 Jul 2016