Sciact
  • EN
  • RU

iOk Platform for Automated Object Detection and Analysis in Microscopy Images Доклады на конференциях

Язык Английский
Тип доклада Устный
Конференция IEEE XVI International Scientific and Technical Conference "Actual Problems of Electronic Instrument Engineering"
10-12 нояб. 2023 , Novosibirsk
Авторы Кудинов Виталий Ю. 1 , Матвеев Андрей Викторович 1 , Нартова Анна Владимировна 1,2 , Санькова Наталья Николаевна 1,2 , Белоцерковский Валерий Александрович 1 , Окунев Алексей Григорьевич 1
Организации
1 Новосибирский национальный исследовательский государственный университет
2 Институт катализа им. Г.К. Борескова СО РАН

Реферат: Counting, measuring, and identifying particles is a crucial aspect of various research endeavors. Typically, images containing particles are manually processed using a software ruler. Automated processing techniques, which rely on conventional image processing methods such as edge detection and segmentation, are not universally applicable and require setting several parameters through trial and error. Additionally, these techniques can only be utilized on high-quality images. Also, the ambiguity of the data set can greatly affect the quality of object identification. The report presents the iOk platform (iok.nsu.ru), which uses artificial intelligence through the ParticlesNN web service and Telegram bots DLgram and No Code ML as well as other means of detecting objects on an image. The platform provides automatic search and analysis of objects in images without pre-processing, regardless of the type and quality of the image. At the output, you can obtain information about object recognition, its area and size, as well as its position in the image. The neural network can be trained on user images, no programming skills are required. All the services are free.
Библиографическая ссылка: Kudinov V.Y. , Matveev A.V. , Nartova A.V. , Sankova N.N. , Belotcerkovskiy V.A. , Okunev A.G.
iOk Platform for Automated Object Detection and Analysis in Microscopy Images
IEEE XVI International Scientific and Technical Conference "Actual Problems of Electronic Instrument Engineering" 10-12 Nov 2023