Mechanism of the Ion Dimer Formation in Secondary Ion Mass Spectrometry
International Journal of Mass Spectrometry (International Journal of Mass Spectrometry and Ion Processes up to 1998)
||Ion dimer, Ion emission, Nickel, SIMS, Sputtering
Boreskov Institute of Catalysis SB RAS
The influence of temperature on the emission of the Ni2+ and Ni+ secondary ions has been investigated in the temperature range from 350 to 1100 K using secondary ion mass spectrometry. The ferroparamagnetic phase transition at T ≅ 620 K on nickel is found to strongly affect only the emission of Ni+ but not the emission of Ni2+. The data show that the Ni2+ dimers form via the ion–molecule recombination reaction in the near surface region rather than by a direct emission of the bound molecules.