The Application of the X-Ray Standing Wave Method to Study Ni/C Layered Structures Obtained by Laser-Assisted Deposition Научная публикация
| Конференция |
10th National Synchrotron Radiation Conference 11-15 июл. 1994 , Новосибирск |
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| Журнал |
Nuclear Instruments and Methods in Physics Research Section A
ISSN: 0168-9002 |
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| Вых. Данные | Год: 1995, Том: 359, Номер: 1-2, Страницы: 175-177 Страниц : 3 DOI: 10.1016/0168-9002(94)01693-3 | ||||
| Авторы |
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| Организации |
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Реферат:
The X-ray standing wave method using fluorescence yield mode was applied to study the profile of the component-by-component distribution between Ni and C layers in NiC layered structures produced by laser-assisted deposition. The method of recurrent relationships was used to calculate the standing wave electric field profile, and to reconstruct the Ni deep distribution. Best fitting was obtained if the intermixing thickness was equal to 3–4 Å.
Библиографическая ссылка:
Chernov V.A.
, Chkhalo N.I.
, Dolbnya I.P.
, Zolotarev K.V.
The Application of the X-Ray Standing Wave Method to Study Ni/C Layered Structures Obtained by Laser-Assisted Deposition
Nuclear Instruments and Methods in Physics Research Section A. 1995. V.359. N1-2. P.175-177. DOI: 10.1016/0168-9002(94)01693-3 WOS Scopus РИНЦ OpenAlex CAPlusCA
The Application of the X-Ray Standing Wave Method to Study Ni/C Layered Structures Obtained by Laser-Assisted Deposition
Nuclear Instruments and Methods in Physics Research Section A. 1995. V.359. N1-2. P.175-177. DOI: 10.1016/0168-9002(94)01693-3 WOS Scopus РИНЦ OpenAlex CAPlusCA
Даты:
| Опубликована в печати: | 1 мая 1995 г. |
| Опубликована online: | 23 февр. 2000 г. |
Идентификаторы БД:
| ≡ Web of science: | WOS:A1995QY84500042 |
| ≡ Scopus: | 2-s2.0-4243488525 |
| ≡ РИНЦ: | 30935266 |
| ≡ OpenAlex: | W2070376755 |
| ≡ Chemical Abstracts: | 1995:539469 |
| ≡ Chemical Abstracts (print): | 122:325420 |