Study of Surface Structure of Catalytic Carbon Filaments by Secondary Ion Mass-Spectroscopy Full article
| Journal |
Reaction Kinetics and Catalysis Letters
ISSN: 0133-1736 , E-ISSN: 1588-2837 |
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| Output data | Year: 1994, Volume: 53, Number: 1, Pages: 197-203 Pages count : 7 DOI: 10.1007/BF02070131 | ||
| Tags | Physical Chemistry; Catalysis; Surface Structure; Dependent Intensity; Defect Layer | ||
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Abstract:
The SIMS method has been used for studying the time dependent intensities of the secondary ions H2O+, O+, CH3+ and C+ under Ar+ bombardment of two CCF samples with different packing of filaments. The thickness of defect layers is estimated from the median of secondary ions distribution.
Cite:
Ivanov V.P.
, Fenelonov V.B.
, Avdeeva L.B.
, Goncharova O.V.
Study of Surface Structure of Catalytic Carbon Filaments by Secondary Ion Mass-Spectroscopy
Reaction Kinetics and Catalysis Letters. 1994. V.53. N1. P.197-203. DOI: 10.1007/BF02070131 WOS Scopus РИНЦ ANCAN OpenAlex
Study of Surface Structure of Catalytic Carbon Filaments by Secondary Ion Mass-Spectroscopy
Reaction Kinetics and Catalysis Letters. 1994. V.53. N1. P.197-203. DOI: 10.1007/BF02070131 WOS Scopus РИНЦ ANCAN OpenAlex
Dates:
| Submitted: | Feb 9, 1994 |
| Accepted: | Mar 28, 1994 |
| Published print: | Sep 1, 1994 |
Identifiers:
| Web of science: | WOS:A1994QD19500026 |
| Scopus: | 2-s2.0-0028514399 |
| Elibrary: | 31161171 |
| Chemical Abstracts: | 1995:331812 |
| Chemical Abstracts (print): | 122:116060 |
| OpenAlex: | W2010433633 |