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ARXPS-Based Concentration Profiles Restoration Applied to Adsorbate/Metal Systems Научная публикация

Журнал Surface Science
ISSN: 0039-6028
Вых. Данные Год: 1992, Том: 271, Номер: 3, Страницы: 493-500 Страниц : 8 DOI: 10.1016/0039-6028(92)90910-X
Ключевые слова RAY PHOTOELECTRON-SPECTROSCOPY; IONIZATION CROSS-SECTIONS; ENERGY ELECTRON-DIFFRACTION; BORN APPROXIMATION; CARBON-MONOXIDE; SURFACE; OXYGEN; ESCA; CHEMISORPTION; ETHYLENE
Авторы Baschenko O.A. 1 , Bukhtiyarov V.I. 2 , Boronin A.I. 2
Организации
1 Institute of General and Inorganic Chemistry, Russian Academy of Sciences, Leninsky Prospect 31, 117907 Moscow, Russia
2 Institute of Catalysis, Lavrentieva Prospect 5, 630090 Novosibirsk, Russia

Реферат: Depth concentration profiles for the O2/Ir(111), CO/Ir(111) and O2/Ag adsorbate/metal systems have been obtained by means of the numerical analysis of the ARXPS data. For the O2/Ir(111) and CO/Ir(111) systems our technique has been found to yield correct coverage estimates and elements in-depth distributions with near-atomic resolution. For the O2/Ag system the oxygen atoms with E(BO 1s) = 528.4 eV have been shown to incorporate between two upper substrate layers, while being completely absent on the surface. The oxygen atoms with E(BO 1s) = 530.5 eV behave quite differently, being present both upon the surface and in the outermost substrate layer.
Библиографическая ссылка: Baschenko O.A. , Bukhtiyarov V.I. , Boronin A.I.
ARXPS-Based Concentration Profiles Restoration Applied to Adsorbate/Metal Systems
Surface Science. 1992. V.271. N3. P.493-500. DOI: 10.1016/0039-6028(92)90910-X WOS Scopus РИНЦ CAPlusCA OpenAlex
Даты:
Поступила в редакцию: 12 авг. 1991 г.
Принята к публикации: 10 дек. 1991 г.
Опубликована в печати: 1 янв. 1992 г.
Опубликована online: 25 сент. 2002 г.
Идентификаторы БД:
Web of science: WOS:A1992JA63900022
Scopus: 2-s2.0-0026882334
РИНЦ: 31146785
Chemical Abstracts: 1992:456604
Chemical Abstracts (print): 117:56604
OpenAlex: W2024945738
Цитирование в БД:
БД Цитирований
Web of science 19
Scopus 20
РИНЦ 22
OpenAlex 16
Альметрики: