ICP-AES Techniques of Silicon, Germanium, and Their Oxides Full article
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Inorganic Materials
ISSN: 0020-1685 , E-ISSN: 1608-3172 |
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| Output data | Year: 2016, Volume: 52, Number: 14, Pages: 1431-1438 Pages count : 8 DOI: 10.1134/S0020168516140077 | ||||
| Tags | atomic emission spectral analysis, determination of impurities, germanium, germanium oxide (IV), inductively coupled plasma, LODs, matrix effect, silicon, silicon oxide (IV) | ||||
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Abstract:
The techniques of atomic emission spectrometry with inductively coupled plasma (ICP-AES) for quantitative determination impuritiesi in silicon, germanium, and their dioxides are developed. Analytical lines for siliconmatrix (29 trace elements) and germanium-matrix (42 trace elements) are selected. Matrix interferences caused by the presence of silicon and germanium in the solutions are studied. The optimal concentrations of matrix are determined. LODs for trace elements are in the range from n × 10–7 to n × 10–5 wt %; RSD < 20%. The accuracy of the results is confirmed by the method of “introduced–found.” The developed techniques are express, simple, and can determine a broad range of trace elements.
Cite:
Khomichenko N.N.
, Shaverina A.V.
, Tsygankova A.R.
, Saprykin A.I.
ICP-AES Techniques of Silicon, Germanium, and Their Oxides
Inorganic Materials. 2016. V.52. N14. P.1431-1438. DOI: 10.1134/S0020168516140077 WOS Scopus РИНЦ AN OpenAlex
ICP-AES Techniques of Silicon, Germanium, and Their Oxides
Inorganic Materials. 2016. V.52. N14. P.1431-1438. DOI: 10.1134/S0020168516140077 WOS Scopus РИНЦ AN OpenAlex
Original:
Хомиченко Н.Н.
, Шаверина А.В.
, Цыганкова А.Р.
, Сапрыкин А.И.
Разработка ИСП-АЭС методик анализа кремния, германия и их оксидов
Заводская лаборатория. Диагностика материалов. 2015. Т.81. №6. С.10-15. RSCI РИНЦ
Разработка ИСП-АЭС методик анализа кремния, германия и их оксидов
Заводская лаборатория. Диагностика материалов. 2015. Т.81. №6. С.10-15. RSCI РИНЦ
Dates:
| Submitted: | Mar 24, 2015 |
| Published print: | Dec 1, 2016 |
| Published online: | Feb 10, 2017 |
Identifiers:
| Web of science: | WOS:000394432700007 |
| Scopus: | 2-s2.0-85011827162 |
| Elibrary: | 29477131 |
| Chemical Abstracts: | 2017:244341 |
| OpenAlex: | W2587398790 |