Sciact
  • EN
  • RU

Simulation of X-ray Powder Diffraction Patterns for One-dimensionally Disordered Crystals Full article

Conference 8th European Powder Diffraction Conference
23-26 May 2002 , Uppsala
Source EPDIC 8 : Proceedings of the 8th European Powder Diffraction Conference, Uppsala, Sweden, May 23-26, 2002
Compilation, Trans Tech Publications. Zurich.2004. 440 c. ISBN 9780878499359.
Journal Materials Science Forum
ISSN: 0255-5476 , E-ISSN: 1662-9752
Output data Year: 2004, Volume: 443-444, Pages: 87-90 Pages count : 4 DOI: 10.4028/www.scientific.net/MSF.443-444.87
Tags Defects, Simulation, X-Ray Powder Diffraction
Authors Cherepanova S.V. 1 , Tsybulya S.V. 1
Affiliations
1 Boreskov Institute Of Catalysis, Pr. Lavrentieva 5, Novosibirsk 630090, Russia

Abstract: Software for the simulation of X-ray powder diffraction (XRPD) patterns for ultrafinegrained materials with some kinds of imperfections has been developed. These calculations are performed on the base of the model of one-dimensionally disordered (1D-disordered) crystal [1]. Such a model can describe stacking faults (SF) and other planar defects (PD) and also finite size of coherently scattering domains. Simulated XRPD pattern is compared with experimental one and can be fitted to it. Potentialities of the software are illustrated by several examples.
Cite: Cherepanova S.V. , Tsybulya S.V.
Simulation of X-ray Powder Diffraction Patterns for One-dimensionally Disordered Crystals
In compilation EPDIC 8 : Proceedings of the 8th European Powder Diffraction Conference, Uppsala, Sweden, May 23-26, 2002. – Trans Tech Publications., 2004. – C.87-90. – ISBN 9780878499359. DOI: 10.4028/www.scientific.net/MSF.443-444.87 WOS Scopus РИНЦ ANCAN OpenAlex
Identifiers:
Web of science: WOS:000189421300016
Scopus: 2-s2.0-17644433991
Elibrary: 23982515
Chemical Abstracts: 2004:163391
Chemical Abstracts (print): 141:286260
OpenAlex: W2048750709
Citing:
DB Citing
Scopus 46
Elibrary 54
Web of science 40
OpenAlex 41
Altmetrics: