Simulation of X-ray Powder Diffraction Patterns for One-dimensionally Disordered Crystals Full article
Conference |
8th European Powder Diffraction Conference 23-26 May 2002 , Uppsala |
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Source | EPDIC 8 : Proceedings of the 8th European Powder Diffraction Conference, Uppsala, Sweden, May 23-26, 2002 Compilation, Trans Tech Publications. Zurich.2004. 440 c. ISBN 9780878499359. |
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Journal |
Materials Science Forum
ISSN: 0255-5476 , E-ISSN: 1662-9752 |
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Output data | Year: 2004, Volume: 443-444, Pages: 87-90 Pages count : 4 DOI: 10.4028/www.scientific.net/MSF.443-444.87 | ||
Tags | Defects, Simulation, X-Ray Powder Diffraction | ||
Authors |
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Affiliations |
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Abstract:
Software for the simulation of X-ray powder diffraction (XRPD) patterns for ultrafinegrained materials with some kinds of imperfections has been developed. These calculations are performed on the base of the model of one-dimensionally disordered (1D-disordered) crystal [1]. Such a model can describe stacking faults (SF) and other planar defects (PD) and also finite size of coherently scattering domains. Simulated XRPD pattern is compared with experimental one and can be fitted to it. Potentialities of the software are illustrated by several examples.
Cite:
Cherepanova S.V.
, Tsybulya S.V.
Simulation of X-ray Powder Diffraction Patterns for One-dimensionally Disordered Crystals
In compilation EPDIC 8 : Proceedings of the 8th European Powder Diffraction Conference, Uppsala, Sweden, May 23-26, 2002. – Trans Tech Publications., 2004. – C.87-90. – ISBN 9780878499359. DOI: 10.4028/www.scientific.net/MSF.443-444.87 WOS Scopus РИНЦ ANCAN OpenAlex
Simulation of X-ray Powder Diffraction Patterns for One-dimensionally Disordered Crystals
In compilation EPDIC 8 : Proceedings of the 8th European Powder Diffraction Conference, Uppsala, Sweden, May 23-26, 2002. – Trans Tech Publications., 2004. – C.87-90. – ISBN 9780878499359. DOI: 10.4028/www.scientific.net/MSF.443-444.87 WOS Scopus РИНЦ ANCAN OpenAlex
Identifiers:
Web of science: | WOS:000189421300016 |
Scopus: | 2-s2.0-17644433991 |
Elibrary: | 23982515 |
Chemical Abstracts: | 2004:163391 |
Chemical Abstracts (print): | 141:286260 |
OpenAlex: | W2048750709 |