X-Ray Photoelectron Spectroscopy for Investigation of Heterogeneous Catalytic Processes | Sciact - CRIS-система Института катализа

X-Ray Photoelectron Spectroscopy for Investigation of Heterogeneous Catalytic Processes Обзор

Журнал

Advances in Catalysis
ISSN: 0360-0564

Вых. Данные

Год: 2009, Том: 52, Номер: Chapter 4, Страницы: 213-272 Страниц : 59 DOI: 10.1016/S0360-0564(08)00004-7

Ключевые слова

SUM-FREQUENCY GENERATION; IN-SITU XPS; REFLECTION-ABSORPTION SPECTROSCOPY; CO OXIDATION REACTION; HIGH-RESOLUTION XPS; HIGH-PRESSURE; METHANOL DECOMPOSITION; CARBON-MONOXIDE; SINGLE-CRYSTAL; ETHYLENE EPOXIDATION

Авторы

Knop-Gericke Axel ¹ , Kleimenov Evgueni ² , Hävecker Michael ¹ , Blume Raoul ¹ , Teschner Detre ¹ , Zafeiratos Spiros ³ , Schlögl Robert ¹ , Bukhtiyarov Valerii I. ⁴ , Kaichev Vasily V. ⁴ , Prosvirin Igor P. ⁴ , Nizovskii Alexander I. ⁴ , Bluhm Hendrik ⁵ , Barinov Alexei ⁶ , Dudin Pavel ⁶ , Kiskinova Maya ⁶

Организации

1	Fritz-Haber-Institut der Max-Planck-Gesellschaft, Department of Inorganic Chemistry, 14195 Berlin, Germany
2	ETH Zurich, Laboratory of Physical Chemistry, HCI E 209, 8093 Zurich, Switzerland
3	LMSPC-UMR 7515 du CNRS, 67087 Strasbourg Cedex 2, France
4	Boreskov Institute of Catalysis SB RAS, Novosibirsk 630090, Russia
5	Lawrence Berkeley National Laboratory, Chemical Sciences Division, Berkeley, CA 94720, USA
6	Sincrotrone Trieste, Microscopy Section, 34012 Trieste, Italy

Информация о финансировании (2)

1	Российский фонд фундаментальных исследований	04-03-32667
2	Российский фонд фундаментальных исследований	06-03-33020

X‐ray photoelectron spectroscopy (XPS) is commonly applied for the characterization of surfaces in ultrahigh vacuum apparatus, but the application of XPS at elevated pressures has been known for more than 35 years. This chapter is a description of the development of XPS as a novel method to characterize surfaces of catalysts under reaction conditions. This technique offers opportunities for determination of correlations between the electronic surface structures of active catalysts and the catalytic activity, which can be characterized simultaneously by analysis of gas‐phase products. Apparatus used for XPS investigations of samples in reactive atmospheres is described here; the application of synchrotron radiation allows the determination of depth profiles in the catalyst, made possible by changes in the photon energy. The methods are illustrated with examples including methanol oxidation on copper and ethene epoxidation on silver. Correlations between the abundance of surface oxygen species and yields of selective oxidation products are presented in detail. Further examples include CO adsorption and methanol decomposition on palladium and CO oxidation on ruthenium.

Knop-Gericke A. , Kleimenov E. , Hävecker M. , Blume R. , Teschner D. , Zafeiratos S. , Schlögl R. , Bukhtiyarov V.I. , Kaichev V.V. , Prosvirin I.P. , Nizovskii A.I. , Bluhm H. , Barinov A. , Dudin P. , Kiskinova M.
X-Ray Photoelectron Spectroscopy for Investigation of Heterogeneous Catalytic Processes
Advances in Catalysis. 2009. V.52. NChapter 4. P.213-272. DOI: 10.1016/S0360-0564(08)00004-7 WOS Scopus РИНЦ CAPlusCA OpenAlex

Опубликована в печати:	1 янв. 2009 г.
Опубликована online:	19 февр. 2009 г.

Web of science:	WOS:000264678800004
Scopus:	2-s2.0-60649122089
РИНЦ:	13606930
Chemical Abstracts:	2009:977751
Chemical Abstracts (print):	151:220586
OpenAlex:	W36319680

БД	Цитирований
Web of science	236
Scopus	256
РИНЦ	262
OpenAlex	226