Abstract: The peculiarities of the structural arrangement of nanocrystalline materials, which are the specific objects of structural analysis, are discussed. For their structural investigation, two approaches for the full profile analysis of X-ray powder diffraction patterns are proposed. Use of the first one (the modified Rietveld algorithm) allows us to refine the average atomic structure parameters, including the atomic coordinates, the Debye—Waller factors, and the occupation of atomic positions for materials for which the X-ray diffraction patterns demonstrate the effects of anisotropic peak broadening, regardless of the nature of these effects. The second method involving full profile analysis based on the statistical structural model of the nanoparticle, taking account of particle size and shape, the probability of planar defects and the correlation in their distribution, the strain field parameters, enables us to obtain quantitative information on the real structure of the nanocrystalline systems. The results of the real structure study of some practically important nanomaterials such as oxides, carbon materials, metals and alloys are also described.

Cite: Tsybulya S.V. , Cherepanova S.V. , Kryukova G.N.
Full Profile Analysis of X-ray Diffraction Patterns for Investigation of Nanocrystalline Systems
In compilation Diffraction Analysis of the Microstructure of Materials. – Springer., 2004. – C.93-123. – ISBN 9783642073526; 9783662067239. DOI: 10.1007/978-3-662-06723-9_4 РИНЦ ANCAN OpenAlex

Identifiers:

Elibrary:	29242843
Chemical Abstracts:	2004:165150
Chemical Abstracts (print):	141:14617
OpenAlex:	W94294333

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