Performance and Characterization of CsI:Tl thin Films for X-ray Imaging Application Научная публикация
| Конференция |
The International Conference "Synchrotron and Free electron laser Radiation: generation and application" 04-07 июл. 2016 , Novosibirsk |
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| Журнал |
Physics Procedia
ISSN: 1875-3892 |
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| Вых. Данные | Год: 2016, Том: 84, Страницы: 245-251 Страниц : 7 DOI: 10.1016/j.phpro.2016.11.042 | ||||
| Ключевые слова | high-resolution, CsI:Tl, thin scintillator films, X-ray imaging, vacuum deposition method, carbon layer | ||||
| Авторы |
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| Организации |
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Реферат:
High spatial resolution thin CsI:Tl scintillator films was prepared by thermal deposition method for X-ray imaging applications. We fabricated CsI:Tl scintillators ranging from 2 μm to 14 μm in thickness. We measured spacial resolution and light yield as a function of input photons energy (5-40 keV) and film thickness. To improve spatial resolution of films carbon post-deposition treatments was performed.
Библиографическая ссылка:
Kozyrev E.A.
, Kuper K.E.
, Lemzyakov A.G.
, Petrozhitskiy A.V.
, Popov A.S.
Performance and Characterization of CsI:Tl thin Films for X-ray Imaging Application
Physics Procedia. 2016.
V.84. P.245-251. DOI: 10.1016/j.phpro.2016.11.042
WOS
Scopus
РИНЦ
CAPlus
OpenAlex
Performance and Characterization of CsI:Tl thin Films for X-ray Imaging Application
Physics Procedia. 2016.
V.84. P.245-251. DOI: 10.1016/j.phpro.2016.11.042
WOS
Scopus
РИНЦ
CAPlus
OpenAlex
Файлы:
Полный текст от издателя
Даты:
| Опубликована online: | 12 дек. 2016 г. |
Идентификаторы БД:
| Web of science: | WOS:000392696400040 |
| Scopus: | 2-s2.0-85016281587 |
| РИНЦ: | 29500846 |
| Chemical Abstracts: | 2016:2089566 |
| OpenAlex: | W2562308432 |