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Scanning SR-XRF Beamline for Analysis of Bottom Sediments Научная публикация

Журнал Nuclear Instruments and Methods in Physics Research Section A
ISSN: 0168-9002
Вых. Данные Год: 2001, Том: 470, Номер: 1-2, Страницы: 376-379 Страниц : 4 DOI: 10.1016/s0168-9002(01)01073-7
Ключевые слова SR-XRF; Trace elements; Microscanning; Lake Baikal; Paleoclimate
Авторы Zolotarev K.V. 1 , Goldberg E.L. 2 , Kondratyev V.I. 1 , Kulipanov G.N. 1 , Miginsky E.G. 1 , Tsukanov V.M. 1 , Phedorin M.A. 2 , Kolmogorov Yu.P. 3
Организации
1 Budker Institute of Nuclear Physics, Lavrentievav11, SB RAS, 630090 Novosibirsk, Russia
2 Limnological Institute of SB RAS, 664033 Irkutsk, Russia
3 United Institute of Geology, Geophysics and Mineralogy, SB RAS, 630090 Novosibirsk, Russia

Реферат: The XRF beamline at the VEPP-3 (Budker INP, Novosibirsk, Russia) storage ring was modified for the performance of scanning analysis. A description and parameters of this facility are presented in the current paper. The initial results of testing of scanning analysis of bottom sediments from Lake Baikal are also presented. A spatial resolution of the scanning analysis is 0.1–1 mm which corresponds to 2–50 years of resolution. Such a scanning analysis of lake sediments provides high quality data as a requirement for paleoclimate reconstructions.
Библиографическая ссылка: Zolotarev K.V. , Goldberg E.L. , Kondratyev V.I. , Kulipanov G.N. , Miginsky E.G. , Tsukanov V.M. , Phedorin M.A. , Kolmogorov Y.P.
Scanning SR-XRF Beamline for Analysis of Bottom Sediments
Nuclear Instruments and Methods in Physics Research Section A. 2001. V.470. N1-2. P.376-379. DOI: 10.1016/s0168-9002(01)01073-7 WOS Scopus РИНЦ CAPlusCA OpenAlex
Даты:
Опубликована online: 28 авг. 2001 г.
Опубликована в печати: 1 сент. 2001 г.
Идентификаторы БД:
Web of science: WOS:000170979000079
Scopus: 2-s2.0-0035450089
РИНЦ: 13375930
Chemical Abstracts: 2001:653530
Chemical Abstracts (print): 136:24790
OpenAlex: W2003962475
Цитирование в БД:
БД Цитирований
Web of science 31
Scopus 35
OpenAlex 32
Альметрики: