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Propagation of Radiation Defects to a Fractally Rough Surface Full article

Journal

High Energy Chemistry
ISSN: 0018-1439

Output data

Year: 1997, Volume: 31, Number: 4, Pages: 229-232 Pages count : 4

Tags

KINETICS

Authors

Okunev A.G. ¹ , Aristov Y.I. ¹

Affiliations

1	Boreskov Institute of Catalysis, Siberian Division, Russian Academy of Sciences, pr. Akademika Lavrent'eva 5, Novosibirsk, 630090 Russia

In terms of a model for a self-similar solid surface, equations were derived to describe the probability that radiation defects formed in the bulk of a solid arrive at the rough surface. The effect of surface roughness was studied under conditions when the ionization depth l0 and the characteristic depth of defect propagation R0 lie in the interval between the lower and the upper self-similarity limits. It was shown that an increase in surface roughness and l0/R0 ratio enhances the propagation considerably. This effect can be of crucial importance for quantitative analysis of radiation-induced catalytic processes on actual surfaces.

Okunev A.G. , Aristov Y.I.
Propagation of Radiation Defects to a Fractally Rough Surface
High Energy Chemistry. 1997. V.31. N4. P.229-232. WOS Scopus РИНЦ ANCAN

Окунев А.Г. , Аристов Ю.И.
Выход радиационных дефектов на фрактально шероховатую поверхность
Химия высоких энергий. 1997. Т.31. №4. С.260-263. РИНЦ

Published print:

Jul 1, 1997

Web of science:	WOS:A1997XN02000004
Scopus:	2-s2.0-27144442846
Elibrary:	13266710
Chemical Abstracts:	1997:504508
Chemical Abstracts (print):	127:113883

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