Mechanism of the Ion Dimer Formation in Secondary Ion Mass Spectrometry Научная публикация
| Журнал |
International Journal of Mass Spectrometry (International Journal of Mass Spectrometry and Ion Processes up to 1998)
ISSN: 1387-3806 |
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| Вых. Данные | Год: 1999, Том: 188, Номер: 3, Страницы: 183-187 Страниц : 5 DOI: 10.1016/S1387-3806(99)00036-6 | ||
| Ключевые слова | Ion dimer, Ion emission, Nickel, SIMS, Sputtering | ||
| Авторы |
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| Организации |
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Реферат:
The influence of temperature on the emission of the Ni2+ and Ni+ secondary ions has been investigated in the temperature range from 350 to 1100 K using secondary ion mass spectrometry. The ferroparamagnetic phase transition at T ≅ 620 K on nickel is found to strongly affect only the emission of Ni+ but not the emission of Ni2+. The data show that the Ni2+ dimers form via the ion–molecule recombination reaction in the near surface region rather than by a direct emission of the bound molecules.
Библиографическая ссылка:
Ivanov V.P.
, Trukhan S.N.
, Borodin A.I.
Mechanism of the Ion Dimer Formation in Secondary Ion Mass Spectrometry
International Journal of Mass Spectrometry (International Journal of Mass Spectrometry and Ion Processes up to 1998). 1999. V.188. N3. P.183-187. DOI: 10.1016/S1387-3806(99)00036-6 WOS Scopus РИНЦ CAPlusCA OpenAlex
Mechanism of the Ion Dimer Formation in Secondary Ion Mass Spectrometry
International Journal of Mass Spectrometry (International Journal of Mass Spectrometry and Ion Processes up to 1998). 1999. V.188. N3. P.183-187. DOI: 10.1016/S1387-3806(99)00036-6 WOS Scopus РИНЦ CAPlusCA OpenAlex
Даты:
| Поступила в редакцию: | 1 июл. 1997 г. |
| Принята к публикации: | 20 июл. 1998 г. |
| Опубликована online: | 2 июн. 1999 г. |
| Опубликована в печати: | 14 июн. 1999 г. |
Идентификаторы БД:
| Web of science: | WOS:000080838100005 |
| Scopus: | 2-s2.0-9744252370 |
| РИНЦ: | 13309534 |
| Chemical Abstracts: | 1999:386327 |
| Chemical Abstracts (print): | 131:108545 |
| OpenAlex: | W2006697094 |