Abstract: Nowadays the method of XAFS spectroscopy in a different methodical options using of SR sources is a recognized powerful tool to study the state of the elements and the local structure for the various nanosystems having different aggregation: alloys, high dispersed material, semiconductors, solutions, glasses and others. In this report, by the example of works performed at the EXAFS station of SSTRC, for a variety of nanosized systems used in catalysis, materials science, biology, demonstrated the possibility of XAFS spectroscopy, as an independent method and in combination with other physical methods of research - HRTEM, XRD, XPS, SEM. The prospects of an integrated approach to study of nanostructured systems: dilute encapsulated ordered semiconductor nanostructures, nanocomposite catalysts having complex composition, biological nanomaterials and others are shown.

Cite: Kriventsov V.V.
Current Status of EXAFS Station of SSTRC. Application of XAFS Spectroscopy for the Study of Promising Functional Nanomaterials
The International Conference "Synchrotron and Free electron laser Radiation: generation and application" 04-07 Jul 2016