High-Pressure Experiments and X-Ray Diffraction Data Reduction: The Difference from Ambient Pressure Studies and Factors Influencing Data Quality Conference Abstracts
Conference |
The Conference and School for Young Scientists High-temperature X-ray Diffraction and X-ray Diffraction of Nanomaterials 19-21 Oct 2020 , Санкт-Петербург |
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Source | Конференция и школа для молодых ученых Терморентгенография и Рентгенография Наноматериалов (ТРРН-4) (Сборник тезисов) Compilation, Санкт-Петербург.2020. 126 c. ISBN 9785965105595. РИНЦ |
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Output data | Year: 2020, Pages: 41 Pages count : 1 | ||||
Authors |
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Affiliations |
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Funding (1)
1 | Russian Foundation for Basic Research | 19-29-12026 |
Cite:
Zakharov B.A.
High-Pressure Experiments and X-Ray Diffraction Data Reduction: The Difference from Ambient Pressure Studies and Factors Influencing Data Quality
In compilation Конференция и школа для молодых ученых Терморентгенография и Рентгенография Наноматериалов (ТРРН-4) (Сборник тезисов). 2020. – C.41. – ISBN 9785965105595. РИНЦ
High-Pressure Experiments and X-Ray Diffraction Data Reduction: The Difference from Ambient Pressure Studies and Factors Influencing Data Quality
In compilation Конференция и школа для молодых ученых Терморентгенография и Рентгенография Наноматериалов (ТРРН-4) (Сборник тезисов). 2020. – C.41. – ISBN 9785965105595. РИНЦ
Identifiers:
Elibrary: | 44088467 |
Citing:
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