Al2O3/InGaAs Interface Passivation by Fluorine-Containing Anodic Layers Full article
Journal |
Journal of Applied Physics
ISSN: 0021-8979 , E-ISSN: 1089-7550 |
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Output data | Year: 2022, Volume: 131, Number: 8, Article number : 085301, Pages count : 9 DOI: 10.1063/5.0078405 | ||||||
Tags | Alumina; Aluminum oxide; Anodic oxidation; Fluorine; Interface states; Passivation | ||||||
Authors |
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Affiliations |
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Funding (1)
1 | Russian Foundation for Basic Research | 20-02-00516 (АААА-А20-120032590012-5) |
Abstract:
The morphology, chemical composition, and electronic properties of Al2O3/InGaAs interfaces with and without anodic oxide layers, formed in DC plasma (O2, Ar) with different contents of the fluorinating component (CF4), were studied. It is shown that thin fluorinated anodic oxide layers, in combination with annealing at 300 °C, reduce the density of interface states by a factor of 3-4 over the entire bandgap. The minimum state density values near the midgap determined by the Terman method are about 2 × 1012 eV-1 cm-2. However, it is demonstrated that, in contrast to the Al2O3/InGaAs interface, the interface with a fluorinated oxide is not stable and degrades when heated above 300 °C. © 2022 Author(s).
Cite:
Aksenov M.S.
, Valisheva N.A.
, Gorshkov D.V.
, Sidorov G.Y.
, Prosvirin I.P.
, Gutakovskii A.K.
Al2O3/InGaAs Interface Passivation by Fluorine-Containing Anodic Layers
Journal of Applied Physics. 2022. V.131. N8. 085301 :1-9. DOI: 10.1063/5.0078405 WOS Scopus РИНЦ ANCAN OpenAlex
Al2O3/InGaAs Interface Passivation by Fluorine-Containing Anodic Layers
Journal of Applied Physics. 2022. V.131. N8. 085301 :1-9. DOI: 10.1063/5.0078405 WOS Scopus РИНЦ ANCAN OpenAlex
Dates:
Submitted: | Nov 12, 2021 |
Accepted: | Feb 7, 2022 |
Published online: | Feb 23, 2022 |
Published print: | Feb 28, 2022 |
Identifiers:
Web of science: | WOS:000761052700001 |
Scopus: | 2-s2.0-85125568855 |
Elibrary: | 48187830 |
Chemical Abstracts: | 2022:490805 |
Chemical Abstracts (print): | 178:305180 |
OpenAlex: | W4212830595 |
Citing:
DB | Citing |
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OpenAlex | 1 |